M38510/76305BEA QP SEMICONDUCTOR, M38510/76305BEA Datasheet
M38510/76305BEA
Specifications of M38510/76305BEA
Related parts for M38510/76305BEA
M38510/76305BEA Summary of contents
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MICROCIRCUITS, DIGITAL, LOW-POWER SCHOTTKY TTL, This specification is approved for use by all Departments The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements ...
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Case outlines. The case outlines should be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator A GDFP5-F14 or CDFP6-F14 B GDFP4-F14 C GDIP1-T14 or CDIP2-T14 D GDFP1-F14 or CDFP2-F14 E GDIP1-T16 or CDIP2-T16 F GDFP2-F16 or ...
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Input clock frequency, f clock Types 01, 02, 10 Input A .......................................................................................... MHz Types 03, 04, 11, 12 ......................................................................... MHz Types 09, 13 ..................................................................................... MHz Types 07, 08 ..................................................................................... 0 to ...
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Government documents. 2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT ...
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Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended case operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. The electrical test requirements for each device class shall ...
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Test Symbol Low-level output voltage V OL High-level output voltage V OH Input clamp voltage V IC Low-level input current I IL1 at reset inputs Low-level input current I IL2 at input A Low-level input current I IL3 at input ...
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Test Symbol High-level input current I IH1 at reset inputs High-level input current I IH2 at reset inputs High-level input current I IH3 at input A High-level input current I IH4 at input A High-level input current I IH5 at ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol High-level input current I IH20 at ET Short circuit output I OS current Supply current I CC High-level supply current I CCH High-level supply current I CCH Low-level supply current I ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol Propagation delay time, t PLH5 low to high, clock to Q Propagation delay time, t PHL5 high to high, clock to Q Propagation delay time, t PLH5 low to high, clock ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol Propagation delay time, t PHL11 high to low, counts up and down Propagation delay time, t PHL12 high to low, clear to Q Propagation delay ...
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MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group B test when using the method 5005 QCI option Group C end-point electrical parameters Group D end-point electrical parameters *PDA applies to subgroup 1. 4.3 ...
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Device type 01 Pin number and INPUT N/C ( INPUT O ( N/C ...
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Device type 05 Pin number 1 N INPUT INPUT B INPUT A 5 INPUT C INPUT B 6 INPUT D N/C 7 ENABLE INPUT ...
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Device type 09 Pin number 1 DATA B N DATA ENABLE DOWN ENABLE N DOWN D ...
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MIL-M-38510/315D Device type 13 CASES Pin number DATA ENABLE G 5 DOWN GND 9 DATA D 10 DATA C 11 LOAD ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams 16 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 17 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 18 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 19 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 20 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 21 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 22 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 23 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 24 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 25 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 26 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 27 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 28 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 29 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 30 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 31 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 32 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 33 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 34 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 35 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 36 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 37 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 38 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 39 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 40 ...
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MIL-M-38510/315D FIGURE 2. Logic diagrams – Continued. 41 ...
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BCD COUNT SEQUENCE (See Note A) OUTPUT COUNT ...
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DEVICE TYE 02 COUNT SEQUENCE (See Note) OUTPUT COUNT ...
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SYNCHRONOUS TRUTH TABLE, DEVICE TYPES 3 AND 11 Input at time t Enable Enable Clock Load ...
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SYNCHRONOUS TRUTH TABLE, DEVICE TYPES 4 AND 12 Input at time t Enable Enable Clock Load ...
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Device type 05 UP COUNT SEQUENCE TABLE (LSB) (MSB ...
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Inputs at time t n Count Count Up Down Load ...
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UP COUNT SEQUENCE TABLE (LSB) (MSB ...
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UP COUNT SEQUENCE TABLE (LSB) (MSB ...
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MIL-M-38510/315D FIGURE 4. Switching time test circuit and waveforms for device type 01. 50 ...
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TEST SWITCH POSITION SW1 SW2 F MAX 1 CLOSED CLOSED OPEN D NOTES: 1. The pulse generator has the following characteristics ns PRR f ...
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MIL-M-38510/315D VOLTAGE WAVEFORMS FIGURE 5. Switching time test circuit and waveforms for device type 02. 52 ...
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TEST SWITCH POSITION SW1 SW2 F MAX 1 CLOSED CLOSED OPEN D NOTES: 1. The pulse generator has the following characteristics ns PRR f ...
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VOLTAGE WAVEFORMS FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12. MIL-M-38510/315D 54 ...
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FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12 – Continued. MIL-M-38510/315D VOLTAGE WAVEFORMS 55 ...
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NOTE: The clear pulse generator has the following characteristics 3 ns, t gen ns, t setup FIGURE 6. Switching time test circuit and waveforms for device types 03, ...
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NOTE: The data pulse generator has the following characteristics ns ns FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12 – Continued. MIL-M-38510/315D = 30 ...
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NOTES: 1. The pulse generator has the following characteristics ns PRR 1 MHz All diodes are 1N3064 or equivalent includes probe and jig capacitance Voltage ...
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MIL-M-38510/315D FIGURE 7. Switching time test circuit and waveforms for device types 05 and 06. 59 ...
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FIGURE 7. Switching time test circuit and waveforms for device types 05 and 06 – Continued. MIL-M-38510/315D 60 ...
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NOTES: 1. The pulse generator has the following characteristics ns PRR 1 MHz All diodes are 1N3064 or equivalent includes probe and jig capacitance Voltage ...
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MIL-M-38510/315D FIGURE 8. Switching time test circuit and waveforms for device types 07. 62 ...
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NOTES: 1. The pulse generator has the following characteristics PRR 1 MHz out 2. All diodes are 1N3064 or equivalent includes probe and jig capacitance Voltage values are with ...
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MIL-M-38510/315D FIGURE 9. Switching time test circuit and waveforms for device type 08. 64 ...
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NOTES: 1. The load and count pulse generators have the following characteristics PRR 1 MHz out 2. All diodes are 1N3064 or equivalent includes probe and jig capacitance Voltage ...
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MIL-M-38510/315D FIGURE 10. Switching time test circuit and waveforms for device type 09. 66 ...
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NOTES: 1. The pulse generator has the following characteristics PRR 1 MHz out 2. All diodes are 1N3064 or equivalent includes probe and jig capacitance Voltage values are with ...
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MIL-M-38510/315D VOLTAGE WAVEFORMS FIGURE 11. Switching time test circuit and waveforms for device type 10. 68 ...
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TEST SWITCH POSITION SW1 SW2 F MAX 1 CLOSED CLOSED OPEN D NOTES: 1. The pulse generator has the following characteristics ns PRR f ...
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MIL-M-38510/315D FIGURE 12. Switching time test circuit and waveforms for device type 13. 70 ...
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NOTES: 1. The pulse generator have the following characteristics PRR 1 MHz out 2. All diodes are 1N3064 or equivalent includes probe and jig capacitance Voltage values are with ...
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Terminal conditions (pins not designated may be H MIL-STD- Cases 1 2 883 A,B,C,D Subgroup Symbol method Cases1 Test no ( 3007 1 2 " 2 " ...
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Cases 1 2 A,B,C,D Subgroup Symbol MIL-STD- Cases 883 2 method Test no ( 3011 37 GND OS " 38 GND " " 40 ...
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Cases 1 2 A,B,C,D Subgroup Symbol MIL-STD- Cases 883 2 method Test no ( Func- 3014 tional " " + tests " ...
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Case 2 pins not referenced are N/C. 2/ Test 4, Pin 12 IL3(MAX). 3/ Apply 4.5 V pulse then ground prior to taking measurements to set device in the desired state. 4/ Apply two pulses ...
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Terminal conditions (pins not designated may be H Cases 1 2 A,B,C,D Subgroup Symbol MIL-STD- Cases1 883 2 method Test no ( 3007 1 GND 2 " ...
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Cases 1 2 A,B,C,D Subgroup Symbol MIL-STD- Cases 883 2 method Test no ( Func- 3014 tional " " tests " 32 ...
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Cases 1 2 A,B,C,D Subgroup Symbol MIL-STD- Cases 883 2 method Test no ( 3003 82 GND MAX (Fig +125 " 83 12/ PLH1 t " ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no. Clear Clock 1 V 3007 1 4 " 2 " " +25 C " 3 " " " 4 ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no. Clear Clock 1 I 3010 38 13/ 5.5 V IH14 " 39 5.5 V IH10 I " 40 5.5 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 tional " +25 C tests " 58 “ ...
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See footnotes at end of device types 03, 04, 11, and 12. Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 115 tional ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 +25 C tional " tests " 58 “ ...
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See footnotes at end of device types 03, 04, 11, and 12. Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 115 tional ...
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MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. Clear Clock 7 Func- 3014 +25 C tional " tests " ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 115 tional " 116 " +25 C tests " 117 “ ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 +25 C tional " tests " ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no. Clear Clock 7 Func- 3014 115 tional " 116 " +25 C tests " 117 “ A ...
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MIL-STD- Cases 1 883 E, F method Subgroup Symbol Case 1/ 2 Test no. Clear Clock (Device types 3003 MAX 151 157 154 168 4 10/ (Fig +125 C t " 152 158 ...
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Cases MIL-STD- Subgroup Symbol Case 883 Test no. Clear Clock method (Device types 3003 176 182 179 193 MAX 10/ (Fig +125 C t ...
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For case 2, pins not referenced are NC. 2/ Apply one pulse prior to measurement as follows: 2.5 V min/5.0 V max Apply 0.7 V for types 03 and 11; apply 2.0 V for ...
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Cases MIL-STD- Subgroup Symbol Case 883 2 method Test no 3007 +25 C " 2 " " 3 " ...
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MIL-STD- Cases 883 Subgroup Symbol Cases1 method 2 Test no 3010 38 5.5 V IH18 " +25 C " 40 5.5 V " 41 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no Func- 3014 +25 C tional " 54 " A tests " 55 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no Func- 3014 tional " 54 " +25 C tests " 55 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no Func- 3014 109 +25 C tional " 110 " B tests " 111 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no See 108 5 PLH5 Tc = +25 C fig. 7 109 “ IN “ 110 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no See 136 PLH5 fig. 7 137 Tc = +125 C " 138 " 139 t " 140 PHL5 ...
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MIL-STD- Cases Subgroup Symbol 883 Cases method Test no See 129 5 PLH5 Tc = +25 C fig. 7 130 “ “ “ 131 ...
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Cases Subgroup Symbol MIL-STD- Cases 883 2 method Test no See 157 PLH5 Tc = +125 C fig. 7 158 " 159 " 160 t " 161 PHL5 ...
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Case 2, pins not referenced are N/C. 2/ Apply one clock pulse prior to test as follows limits ( A) min/max values for circuits shown: IL Parameter Terminals A ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no 3007 " +25 C " 3 " ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no 3011 45 GND OS " 46 5.5 V GND Tc = +25 C " 47 " 48 “ ...
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MIL-STD- Cases 883 Subgroup Symbol Cases1 method 2 Test no Func- 3014 +25 C tional " 53 " " tests " 54 " ...
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MIL-STD- Cases 883 Subgroup Symbol Cases1 method 2 Test no Func- 3014 102 +25 C tional " 103 A " tests " 104 B ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no Func- 3014 +25 C tional " 53 " " tests " 54 " ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no Func- 3014 108 +25 C tional " 109 " " tests " 110 " ...
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Cases MIL-STD Subgroup Symbol 883 Case method 2 (Device type 3003 MAX 116 161 OUT + ...
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Cases MIL-STD 883 Subgroup Symbol Case method 2 (Device type 3003 MAX 146 191 MAX ...
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Case 2, pins not referenced are N/C. 2/ Apply 0.7 V for device type 07; apply 2.0 V for device type 08 limits ( A) min/max values for circuits shown: IL Parameter Terminals A B -160/-400 -160/-400 ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no 3007 1 0 " +25 C " 3 " ...
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MIL-STD- Cases 883 Subgroup Symbol Cases1 method 2 Test no 3010 38 5.5 V IH18 Tc = +25 C " 39 " 40 " 41 “ 42 “ ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no Func- 3014 +25 C tional " 53 " " tests " 54 " ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no Func- 3014 102 tional " 103 B " +25 C tests " 104 A " ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no Func- 3014 +25 C tional " 53 " " tests " 54 " " ...
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Cases MIL-STD- Subgroup Symbol Cases1 883 2 method Test no Func- 3014 102 +25 C tional " 103 " L tests " 104 " " ...
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Cases MIL-STD Subgroup Symbol 883 Case method 2 (Device type 3003 MAX 152 150 OUT + ...
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Cases MIL-STD Subgroup Symbol 883 Case method 2 (Device type 3003 MAX 171 169 +125 C t " 172 ...
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Case 2, pins not referenced are N/C. 2/ Apply 2.0 for device type 09; apply 0.7 V for device type 13 limits ( A) min/max values for circuits shown: IL Parameter Terminals A B -160/-400 I Enable ...
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Cases 1 2 MIL-STD Subgroup Symbol 883 Cases1 method 2 Test no 3007 1 GND OL " +25 C " 3 “ " 4 “ ...
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Terminal conditions (pins not designated may be high Cases MIL-STD Subgroup Symbol 883 Cases1 method 2 Test no Func- 3014 Tional " ...
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Case 2, pins not referenced are N/C. 2/ Apply 4.5 volts pulse, then ground prior to taking measurements to set device in the desired state. Maintain ground for measurement. 3/ Input pulse must be applied one time after R ...
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PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel performed by DoD or in-house contractor personnel, these personnel need ...
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Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ........................................... Ground zero voltage potential I ................................................ Current flowing into an input terminal IN V ............................................... Input clamp voltage ...
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Manufacturers’ designation. Manufacturers’ circuits which form a part of this specification are designated with an “X” as shown in table IV herein. Circuit A Device type Manufacturer Texas Instruments, Commercial Incorporated Type 01 54LS90 X 02 54LS93 X 03 ...
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Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Review activities: Army – SM, MI Navy - AS, CG, MC Air Force – 03, 19, 99 MIL-M-38510/315D Preparing activity: (Project 5962-1996) 126 DLA ...