M38510/76302BEA QP SEMICONDUCTOR, M38510/76302BEA Datasheet - Page 11

• Manufacturer Part Number: M38510/76302BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/76302BEA

• Lead Free Status / Rohs Status: Supplier Unconfirmed

PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
electrical parameters shall be as specified in table II herein.
conventional and positive when flowing into the referenced terminal.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535 .
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
*PDA applies to subgroup 1.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Group B test when using the method 5005
QCI option
Group C end-point electrical
Group D end-point electrical parameters
parameters
MIL-PRF-38535 test requirements
TABLE II. Electrical test requirements.
MIL-M-38510/315D
11
1*, 2, 3, 7,
9, 10, 11
1, 2, 3, 7, 8,
9, 10, 11
1, 2, 3, 7
8, 9, 10, 11
1, 2, 3, 7, 8
9, 10, 11
1, 2, 3
Class S
devices
Subgroups (see table III)
1
1*, 2, 3,
7, 9
1, 2, 3, 7, 8,
9, 10, 11
1, 2, 3
1, 2, 3
N/A
Class B
devices
1