2-353047-2 TE Connectivity, 2-353047-2 Datasheet - Page 9

DYNAMIC D-5200S TAB HSG 2P K/Y

2-353047-2

Manufacturer Part Number
2-353047-2
Description
DYNAMIC D-5200S TAB HSG 2P K/Y
Manufacturer
TE Connectivity
Series
353047 Seriesr
Datasheets

Specifications of 2-353047-2

Product Type
Receptacle Housings
Voltage Rating
630 V
Number Of Positions / Contacts
2
Mounting Style
Panel Mount
Housing Material
Thermoplastic
Number Of Rows
1
Connector Type
Housing
Mount
Panel
Keyed
Yes
Product Series
D-5200S
Pcb Mount Retention
Without
Keying
Y
Voltage Rating (vac)
630
Number Of Positions
2
Contact Type
Pin
Connector Style
Plug
Ul Flammability Rating
UL 94V-0
Housing Color
Black
Rohs/elv Compliance
RoHS compliant, ELV compliant
Lead Free Solder Processes
Not relevant for lead free process
Rohs/elv Compliance History
Always was RoHS compliant
Applies To
Wire/Cable
Packaging Quantity
100
Packaging Method
Bag
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
2-353047-2
Manufacturer:
TE Connectivity AMP Connectors
Quantity:
2 665
4. 製品認定試験の試験順序
4. Product Qualification Test Sequence
製品の確認検査
総合抵抗
(ローレベル)
耐電圧
絶縁抵抗
温度上昇
振動
衝撃
コネクタ挿入力
コネクタ引抜力
ハウジングロック強度
コンタクト装着力
コンタクト保持力
圧着部引張強度
耐久性
(繰り返し挿抜)
はんだ付け性
はんだ耐熱性
熱衝撃
温湿度サイクリング
亜硫酸ガス
高温寿命
硫化水素
(a)欄内の数字は試験を実施する順序を示す。/Numbers indicate sequence in which tests are performed.
Rev. C
試験項目
Fig. 3 製品認定試験の試験順序 / Product Qualification Test Sequence Test
Examination of Product
Contact Resistance
(Low Level)
Dielectric withstanding
Voltage
Insulation Resistance
Temperature Rising
Vibration
Physical Shock
Conn. Mating Force
Conn. Unmating Force
Conn. Locking Strength
Cont. Insertion Force
Cont. Retention Force
Crimp Tensile Strength
Durability (Repeated
Mate/Unmating)
Solderability
Resistance to
Soldering heat
Thermal Shock
Humidity-Temperature
Cycling
Industrial SO
Temperature Life
Industrial H
Test Examination
Fig.4 総合抵抗測定 / Measurement of contact resistance
2
S gas
2
gas
Product Specification
2,5,
3,6
1
1
4
2,5
2
1
3
4
2,4,6
8,10
3
1
3
7
9
5
2,5
4
1
3
4
試験順序/Test Sequence(a)
mΩ=(V-Vw)/A
試験グループ/Test Group
5
1
2
3,6
2,5
6
1
4
7
1
2
8
1
2
3
9
1
2
10
1
2
108-5453
11
1
2
9 of 11
2,5
12
1
3
4

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