DS1230AB-70+ Dallas Semiconductor, DS1230AB-70+ Datasheet - Page 6
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DS1230AB-70+
Manufacturer Part Number
DS1230AB-70+
Description
RAM NV 256K 5% VTP-70NS
Manufacturer
Dallas Semiconductor
Datasheet
1.DS1230Y-200.pdf
(7 pages)
Specifications of DS1230AB-70+
Capacitance, Input
5 pF
Capacitance, Output
5 pF
Current, Input, Leakage
±1 μA
Current, Operating
85 mA
Current, Output, Leakage
±1
Data Retention
10 yrs.
Density
256K
Interface
Parallel Bus
Memory Type
Non-Volatile SRAM
Organization
32K×8
Package Type
740 EMOD
Temperature, Operating
0 to +70 °C
Time, Access
70 ns
Time, Address Hold
5
Time, Fall
5 ns
Time, Rise
5 ns
Voltage, Input, High
5 V
Voltage, Input, Low
0.8 V
Voltage, Supply
5 V
Lead Free Status / Rohs Status
RoHS Compliant part
WARNING:
Under no circumstance are negative undershoots, of any amplitude, allowed when device is in battery
backup mode.
NOTES:
1.
2.
3. t
4. t
5. These parameters are sampled with a 5 pF load and are not 100% tested.
6. If the
7. If the
8. If
9. Each DS1230 has a built-in switch that disconnects the lithium source until the user first applies V
10. All AC and DC electrical characteristics are valid over the full operating temperature range. For
11. In a power-down condition the voltage on any pin may not exceed the voltage on V
12. t
13. t
14. DS1230 modules are recognized by Underwriters Laboratory (U.L.®) under file E99151.
DC TEST CONDITIONS
Outputs Open
Cycle = 200 ns for operating current
All voltages are referenced to ground
PARAMETER
Expected Data Retention Time
going low to the earlier of
buffers remain in a high-impedance state during this period.
buffers remain in high-impedance state during this period.
the output buffers remain in a high-impedance state during this period.
The expected t
is first applied by the user. This parameter is assured by component selection, process control, and
design. It is not measured directly during production testing.
commercial products, this range is 0°C to 70°C. For industrial products (IND), this range is -40°C to
+85°C.
WE
OE
WP
DH
WR1
WR2
WE
, t
= V
is specified as the logical AND of
is high for a Read Cycle.
and t
and t
DS
CE
CE
is low or the
are measured from the earlier of
IH
DH1
DH2
or V
low transition occurs simultaneously with or latter than the
high transition occurs prior to or simultaneously with the
are measured from
are measured from
IL
DR
. If
is defined as accumulative time in the absence of V
OE
WE
= V
low transition occurs prior to or simultaneously with the
CE
IH
during write cycle, the output buffers remain in a high-impedance state.
or
CE
WE
WE
going high.
going high.
going high.
SYMBOL
CE
CE
t
or
and
DR
8 of 13
WE
AC TEST CONDITIONS
Output Load: 100 pF + 1TTL Gate
Input Pulse Levels: 0 - 3.0V
Timing Measurement Reference Levels
Input pulse Rise and Fall Times: 5 ns
WE
going high.
. t
MIN
WP
10
Input: 1.5V
Output: 1.5V
is measured from the latter of
TYP
CC
WE
WE
MAX
starting from the time power
high transition, the output
low transition, the output
UNITS
CC
CE
years
.
low transition,
(t
DS1230Y/AB
CE
A
=25°C)
NOTES
or
9
WE
CC
.