IDT82P2282PF8 IDT, Integrated Device Technology Inc, IDT82P2282PF8 Datasheet - Page 362

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IDT82P2282PF8

Manufacturer Part Number
IDT82P2282PF8
Description
TXRX T1/J1/E1 2CHAN 100-TQFP
Manufacturer
IDT, Integrated Device Technology Inc
Type
Transceiverr
Datasheet

Specifications of IDT82P2282PF8

Number Of Drivers/receivers
2/2
Protocol
IEEE 1149.1
Voltage - Supply
3 V ~ 3.6 V
Mounting Type
Surface Mount
Package / Case
100-TQFP, 100-VQFP
Screening Level
Industrial
Pin Count
100
Mounting
Surface Mount
Package Type
TQFP
Operating Temperature (min)
-40C
Operating Temperature (max)
85C
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
82P2282PF8

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IDT82P2282PF8
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
IDT82P2282
Table 85: TAP Controller State Description (Continued)
IEEE STD 1149.1 JTAG Test Access Port
Update-IR The instruction shifted into the instruction register is latched into the parallel output from the shift-register path on the falling edge of TCK. When the new
Pause-IR The pause state allows the test controller to temporarily halt the shifting of data through the instruction register. The test data register selected by the cur-
Exit2-IR
State
rent instruction retains its previous value and the instruction does not change during this state. The controller remains in this state as long as TMS is low.
When TMS goes high and a rising edge is applied to TCK, the controller moves to the Exit2-IR state.
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR state, which
terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-IR state. The test data register
selected by the current instruction retains its previous value and the instruction does not change during this state.
instruction has been latched, it becomes the current instruction. The test data registers selected by the current instruction retain their previous value.
362
Description
DUAL T1/E1/J1 LONG HAUL / SHORT HAUL TRANSCEIVER
August 20, 2009

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