CAT1640WI-30-G ON Semiconductor, CAT1640WI-30-G Datasheet - Page 5

• Manufacturer Part Number: CAT1640WI-30-G
• Description: Supervisory Circuits CPU w/64K
• Manufacturer: ON Semiconductor

Specifications of CAT1640WI-30-G

• Number Of Voltages Monitored: 1
• Monitored Voltage: 3 V, 3.3 V, 5 V
• Output Type: Active Low, Open Drain
• Manual Reset: Resettable
• Watchdog: No Watchdog
• Battery Backup Switching: No Backup
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 3 V
• Supply Current (typ): 3000 uA
• Maximum Power Dissipation: 1000 mW
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Package / Case: SOIC-8 Wide
• Minimum Operating Temperature: - 40 C
• Power Fail Detection: No
• Undervoltage Threshold: 3 V
• Overvoltage Threshold: 3.15 V
• Power-up Reset Delay (typ): 270 ms
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Notes:
1. This parameter is tested initially and after a design or process change that affects the parameter. Not 100% tested.
2. Latch-up protection is provided for stresses up to 100mA on input and output pins from -1V to V
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice.
Notes:
1. Test Conditions according to “AC Test Conditions” table.
2. Power-up, Input Reference Voltage V
3. Power-Down, Input Reference Voltage V
4. V
5. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
6. t
RELIABILITY CHARACTERISTICS
AC TEST CONDITIONS
RESET CIRCUIT A.C. CHARACTERISTICS
P
Symbol
N
T
V
I
O
M
LTH
DR
S
S
ZAP
END
PUR
R
W
t
CC
y
t
y
G
P
t
t
(1)
(1)(2)
t
t
m
M
m
P
U
R
L
P
(1)
l G
T I
E
U
(1)
R
U
Glitch Reference Voltage = V
O
R
P
and t
b
b
W
D
W
R
n I
S
C
n I
R
c t i
u
T
H
l o
l o
p
n I
p t
p
-
h
t u
PUW
u
U
p
t u
r t
t u
P
e r
O
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
e r
s i
are the delays required from the time V
u
p
e f
I T
e
e f
p t
u
e r
M
V
s l
a
e r
P
P
M
t u
V
n
C
a
n
e
o
o
n
C
T
c
d
n
N I
w
w
L
H
c
v
e
l G
u
o
e
e
f
e
l o
o t
l a
l a
a
v
G
- r
- r
c t i
a t
v
M
l o
d
i t l
U
U
R
R
l o
R
5
g
a t
h
R
6 ,
P
P
p
e
E
p
m
a t
e
e
s
g
R
a
S
s
a
P
s
o t
o t
e
g
t e
e
a r
t e
a r
e
E
THmin
u
s
e
s
e j
R
W
T
s l
s
m
i T
m
l G
CC
t c
e
e
o
i r
m
t e
t e
a
; Based on characterization data
c t i
e t
u
W
P
= V
CC
d
e
r e
p t
r e
MIL-STD-883, Test Method 1033 1,000,000
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
h
o
u
d i
O
O
t u
= V
t u
TH
s l
I
h t
p
p
m
e
, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
r e
D
r e
Reference Test Method
TH
m
W
e
t a
t a
, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
JEDEC Standard 17
u
a l
d i
n
o i
o i
y
h t
y t i
n
CC
n
C
r u
is stable until the specified memory operation can be initiated.
e r
0
t n
C
C
0
2 .
3 .
C
N
o
o
S
5
V
N
N
N
N
L
n
o
n
V
o
T
T
C
0
o
o
e t
o
o
=
d
d
u
1
C
C
e
e
5 .
e t
e t
e t
e t
C
c r
t i
t i
0
t s
t s
o t
,
, 4
1
o i
o i
V
: e
n
0
2
3
5
5
0
C
0
s
n
n
7 .
5
0
C
8 .
s
s
p
I
V
O
V
F
C
L
C
C
=
C
3
m
M
M
1
5
3
; A
n i
n i
0
2000
Min
100
100
CC
T
T
2
+ 1V.
y
y
0
p
p
0
Max
CAT1640, CAT1641
M
M
2
2
2
1
3
7
5
0
7
7
a
a
0
0
0
0
0
x
x
Cycles/Byte
Doc No. MD-3012, Rev. D
Years
Units
Volts
mA
U
U
m
m
m
µ
µ
i n
n
n
i n
s
s
s
s
s
s
s
s t
s t