LC4256ZE-B-EVN Lattice, LC4256ZE-B-EVN Datasheet - Page 32

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LC4256ZE-B-EVN

Manufacturer Part Number
LC4256ZE-B-EVN
Description
Programmable Logic Development Tools ispMACH 4256ZE Breakout Board
Manufacturer
Lattice
Series
ispMACH®r
Type
CPLDr

Specifications of LC4256ZE-B-EVN

Contents
Board, Cable
Lead Free Status / Rohs Status
 Details
For Use With/related Products
LC4256ZE-5TN144C
Lattice Semiconductor
Switching Test Conditions
Figure 17 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 13.
Figure 17. Output Test Load, LVTTL and LVCMOS Standards
Table 13. Test Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
1. C
L
includes test fixtures and probe capacitance.
Test Condition
DUT
106 106
106
106
R
1
106
106
R
2
V
R 1
R 2
32
CCO
35pF
35pF
35pF
5pF
5pF
C
L
1
C L
ispMACH 4000ZE Family Data Sheet
LVCMOS 1.8 =
LVCMOS 1.5 =
LVCMOS 2.5 =
LVCMOS 3.3 = 1.5V
0213A/ispm4k
Timing Ref.
V
V
Point
OH
OL
Test
1.5V
1.5V
+ 0.3
- 0.3
V
V
V
CCO
CCO
CCO
2
2
2
LVCMOS 1.8 = 1.65V
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
LVCMOS 1.5 = 1.4V
V
3.0V
3.0V
3.0V
3.0V
CCO

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