ADV7181BST Analog Devices Inc, ADV7181BST Datasheet - Page 10

• Manufacturer Part Number: ADV7181BST
• Description: IC VIDEO DECODER SDTV 64-LQFP
• Manufacturer: Analog Devices Inc
• Type: Video Decoderr

Specifications of ADV7181BST

• Rohs Status: RoHS non-compliant
• Applications: Recorders, Set-Top Boxes
• Voltage - Supply, Analog: 3.15 V ~ 3.45 V
• Voltage - Supply, Digital: 1.65 V ~ 2 V
• Mounting Type: Surface Mount
• Package / Case: 64-LQFP
• Adc/dac Resolution: 9b
• Screening Level: Industrial
• Package Type: LQFP
• Pin Count: 64
• For Use With: EVAL-ADV7181BEB - BOARD EVALUATION FOR ADV7181
• Lead Free Status / RoHS Status: Compliant

ADV7181B
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter
A
A
D
P
D
D
P
D
D
A
A
Digital Inputs Voltage to DGND
Digital Output Voltage to DGND
Analog Inputs to AGND
Maximum Junction Temperature
Storage Temperature Range
Infrared Reflow Soldering
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
VDD
VDD
VDD
VDD
VDD
VDDIO
VDDIO
VDDIO
VDDIO
VDD
VDD
(T
(20 sec)
to AGND
to D
J
to GND
to AGND
– P
– D
to DGND
max)
to DGND
to A
– P
– D
VDD
VDD
VDD
VDD
VDD
VDD
Rating
4 V
4 V
2.2 V
2.2 V
4 V
–0.3 V to +0.3 V
–0.3 V to +0.3 V
–0.3 V to +2 V
–0.3 V to +2 V
–0.3 V to +2 V
–0.3 V to +2 V
–0.3 V to D
–0.3 V to D
AGND – 0.3 V to A
150°C
–65°C to +150°C
260°C
VDDIO
VDDIO
+0.3 V
+0.3 V
VDD
+ 0.3 V
Rev. B | Page 10 of 100
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.