UJA1065TW/5V0/512 NXP Semiconductors, UJA1065TW/5V0/512 Datasheet - Page 46

• Manufacturer Part Number: UJA1065TW/5V0/512
• Description: IC CAN/LIN FAIL-SAFE HS 32HTSSOP
• Manufacturer: NXP Semiconductors

Specifications of UJA1065TW/5V0/512

• Applications: *
• Interface: *
• Voltage - Supply: *
• Package / Case: 32-TSSOP Exposed Pad, 32-eTSSOP, 32-HTSSOP
• Mounting Type: Surface Mount
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 935288868512

NXP Semiconductors
7. Limiting values
Table 25.
In accordance with the Absolute Maximum Rating System (IEC 60134). All voltages are referenced to GND.
[1]
[2]
[3]
[4]
[5]
UJA1065_7
Product data sheet
Symbol
V
V
V
V
I
T
T
T
V
WAKE
stg
amb
vj
BAT42
BAT14
DC(n)
trt
esd
Only relevant if V
In accordance with IEC 60747-1. An alternative definition of virtual junction temperature is: T
is a fixed value to be used for the calculation of T
ambient temperature (T
Human Body Model (HBM): C = 100 pF; R = 1.5 kΩ.
ESD performance according to IEC 61000-4-2 (C = 150 pF, R = 330 Ω) of pins CANH, CANL, RTH, RTL, LIN, RTLIN, WAKE, BAT42
and V3 with respect to GND was verified by an external test house. Following results were obtained:
a) Equal or better than ±4 kV (unaided)
b) Equal or better than ±20 kV (using external ESD protection: NXP Semiconductors PESD1CAN and PESD1LIN diode)
Machine Model (MM): C = 200 pF; L = 0.75 μH; R = 10 Ω.
Limiting values
Parameter
BAT42 supply voltage
BAT14 supply voltage
DC voltage on pins
transient voltage at pins CANH, CANL
and LIN
DC current at pin WAKE
storage temperature
ambient temperature
virtual junction temperature
electrostatic discharge voltage
V1 and V2
V3 and SYSINH
INH/LIMP
SENSE
WAKE
CANH, CANL, SPLIT, LIN and RTLIN with respect to any other pin
TXDC, RXDC, TXDL, RXDL, SDO,
SDI, SCK, SCS, RSTN, INTN and
EN
TEST
WAKE
< V
amb
GND
).
− 0.3 V; current will flow into pin GND.
vj
Rev. 07 — 25 February 2010
. The rating for T
Conditions
load dump; t ≤ 500 ms
V
in accordance with
ISO 7637-3
HBM
MM; at any pin
BAT42
continuous
load dump; t ≤ 500 ms
at pins CANH, CANL,
SPLIT, LIN, RTLIN,
WAKE, BAT42, V3,
SENSE; with respect to
GND
at any other pin
≥ V
vj
BAT14
limits the allowable combinations of power dissipation (P
High-speed CAN/LIN fail-safe system basis chip
− 1 V
[1]
[2]
[3]
[4]
[5]
vj
= T
Min
−0.3
-
−0.3
-
−0.3
−1.5
−0.3
−0.3
−1.5
−60
−0.3
−0.3
−150
−15
−55
−40
−40
−8.0
−2.0
−200
amb
+ P
d
× R
th(vj-amb)
Max
+60
+60
+33
+45
+5.5
V
V
V
+60
+60
V
+15
+100
-
+150
+125
+150
+8.0
+2.0
+200
UJA1065
BAT42
BAT42
BAT42
V1
© NXP B.V. 2010. All rights reserved.
+ 0.3
, where R
+ 0.3
+ 0.3
+ 1.2
d
) and
46 of 76
Unit
V
V
V
V
V
V
V
V
V
V
V
V
V
mA
°C
°C
°C
kV
kV
V
th(vj-amb)