LH28F008SCN-TF Sharp Electronics, LH28F008SCN-TF Datasheet - Page 36

• Manufacturer Part Number: LH28F008SCN-TF
• Manufacturer: Sharp Electronics

Specifications of LH28F008SCN-TF

• Lead Free Status / Rohs Status: Compliant

NOTES:
1. Read timing characteristics during block erase, byte write and lock-bit configuration operations are the same as
2. Sampled, not 100% tested.
3. Refer to Table 4 for valid A
4. V
5. See Ordering Information for device speeds (valid operational combinations).
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Seed
7. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
AVAV
PHWL
ELWL
WLWH
PHHWH
VPWH
AVWH
DVWH
WHDX
WHAX
WHEH
WHWL
WHRL
WHGL
QVVL
QVPH
Sym.
during read-only operations. Refer to AC Characteristics for read-only operations.
byte write, or lock-bit configuration success (SR.1/3/4/5=0).
Configuration) for testing characteristics.
Configuration) for testing characteristics.
PP
should be held at V
Write Cycle Time
RP# High Recovery to WE# Going Low
CE# Setup to WE# Going Low
WE# Pulse Width
RP# V
V
Address Setup to WE# Going High
Data Setup to WE# Going High
Data Hold from WE# High
Address Hold from WE# High
CE# Hold from WE# High
WE# Pulse Width High
WE# High to RY/BY# Going Low
Write Recovery before Read
V
RP# V
High
PP
PP
Setup to WE# Going High
Hold from Valid SRD, RY/BY# High
Versions
HH
HH
Setup to WE# Going High
Hold from Valid SRD, RY/BY#
Parameter
(5)
PPH1/2/3
IN
and D
(and if necessary RP# should be held at V
V
CC
IN
=5V±0.5V, 5V±0.25V, T
for block erase, byte write, or lock-bit configuration.
V
V
CC
CC
=5V±0.25V LH28F008SC-L85
=5V±0.5V
LHF08CTF
Notes
2,4
2,4
2
2
2
3
3
A
=0°C to +70°C
Min.
100
100
85
50
40
40
25
1
0
5
5
0
0
0
0
Max.
90
HH
) until determination of block erase,
(6)
LH28F008SC-L90
Min.
100
100
90
50
40
40
25
1
0
5
5
0
0
0
0
Max.
90
(7)
Rev. 1.3
Unit
ns
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
33