552AF000127DG Silicon Laboratories Inc, 552AF000127DG Datasheet - Page 6
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552AF000127DG
Manufacturer Part Number
552AF000127DG
Description
Manufacturer
Silicon Laboratories Inc
Datasheet
1.552AF000127DG.pdf
(14 pages)
Specifications of 552AF000127DG
Lead Free Status / Rohs Status
Compliant
Si 552
Table 7. CLK± Output Phase Noise (Typical)
Table 9. Environmental Compliance
The Si552 meets the following qualification test requirements.
6
Table 8. Absolute Maximum Ratings
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solvents
Maximum Operating Temperature
Supply Voltage
Input Voltage (any input pin)
Storage Temperature
ESD Sensitivity (HBM, per JESD22-A114)
Soldering Temperature (Pb-free profile)
Soldering Temperature Time @ T
Notes:
Offset Frequency
1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional
2. The device is compliant with JEDEC J-STD-020C. Refer to Si5xx Packaging FAQ available for download from
operation or specification compliance is not implied at these conditions. Exposure to maximum rating conditions for
extended periods may affect device reliability.
www.silabs.com/VCXO
100 MHz
100 kHz
10 MHz
100 Hz
10 kHz
1 MHz
1 kHz
Parameter
Parameter
for further information, including soldering profiles.
74.25 MHz
90 ppm/V
PEAK
LVPECL
–114
–132
–142
–148
–150
–87
n/a
(Pb-free profile)
2
1
Rev. 0.6
2
491.52 MHz
45 ppm/V
LVPECL
–100
–124
–135
–146
–147
–116
Symbol
–75
T
T
ESD
V
AMAX
PEAK
T
V
t
DD
P
S
I
MIL-STD-883F, Method 2002.3 B
MIL-STD-883F, Method 2007.3 A
MIL-STD-883F, Method 1014.7
MIL-STD-883F, Method 203.8
MIL-STD-883F, Method 2016
Conditions/Test Method
–0.5 to V
–0.5 to +3.8
–55 to +125
Rating
20–40
2500
260
622.08 MHz
135 ppm/V
85
LVPECL
DD
–109
–121
–134
–146
–147
–65
–90
+ 0.3
seconds
Units
Volts
Volts
Volts
ºC
ºC
ºC
dBc/Hz
Units