ATmega88 Automotive Atmel Corporation, ATmega88 Automotive Datasheet - Page 14

• Manufacturer Part Number: ATmega88 Automotive
• Manufacturer: Atmel Corporation

Specifications of ATmega88 Automotive

• Flash (kbytes): 8 Kbytes
• Pin Count: 32
• Max. Operating Frequency: 16 MHz
• Cpu: 8-bit AVR
• # Of Touch Channels: 12
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 23
• Ext Interrupts: 24
• Usb Speed: No
• Usb Interface: No
• Spi: 2
• Twi (i2c): 1
• Uart: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 15
• Analog Comparators: 1
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 1
• Eeprom (bytes): 512
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 150
• I/o Supply Class: 2.7 to 5.5
• Operating Voltage (vcc): 2.7 to 5.5
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 3
• Output Compare Channels: 6
• Input Capture Channels: 1
• Pwm Channels: 6
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

2.8
14
Grade 0 Qualification
ATmega88/168 Automotive
Figure 2-25. Analog to Digital Converter INL versus V
The ATmega88/168 has been developed and manufactured according to the most stringent
quality assurance requirements of ISO-TS-16949 and verified during product qualification as per
AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field
usage however may result in less significant stress test acceleration. In order to prevent the risk
that ATmega88/168 lifetime would not satisfy the application end-of-life reliability requirements,
Atmel
High Temperature Storage Life, Data Retention, Thermal Cycles), far beyond the AEC-Q100
requirements. Thereby, Atmel verified the ATmega88/168 has a long safe lifetime period after
the grade 0 qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mecha-
nism that is considered. Examples are given in
profile which could exceed the AEC-Q100 equivalence domain shall be submitted to Atmel for a
thorough reliability analysis
Figure 2-26. AEC-Q100 Lifetime Equivalence
®
has extended the testing, whenever applicable (High Temperature Operating Life Test,
1000000
100000
10000
1000
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
100
10
0
-50
1
0
-25
HTOL 0.59eV
HTSL 0.45eV
20
0
40
25
Temperature (°C)
60
Temperature
Figure
50
80
2-26. Therefore any temperature mission
CC
75
100
100
120
125
140
4 IDL
4 STD
150
160
7607H–AVR–02/10