AD760 Analog Devices, AD760 Datasheet - Page 3

• Manufacturer Part Number: AD760
• Description: 16/18-Bit Self-Calibrating Serial/Byte DACPORT
• Manufacturer: Analog Devices

Specifications of AD760

• Resolution (bits): 18bit
• Dac Update Rate: 167kSPS
• Dac Settling Time: 6µs
• Max Pos Supply (v): +15.75V
• Single-supply: No
• Dac Type: Voltage Out
• Dac Input Format: Byte,Ser

REV. A
NOTES
1
2
3
4
5
6
7
8
Specifications subject to change without notice.
AC PERFORMANCE CHARACTERISTICS
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested. (T
< T
Parameter
Output Settling Time
MUX
Total Harmonic Distortion + Noise
Signal-to-Noise Ratio
Digital-to-Analog Glitch Impulse
MUX
Digital Feedthrough
Output Noise Voltage Density (1 kHz–1 MHz)
Reference Noise (1 kHz–1 MHz)
Specifications are subject to change without notice.
full-scale range and is 10 V in unipolar mode and 20 V in bipolar mode.
AD760 can be used with a precision external reference such as the AD587, AD586 or AD688.
section.
For 18-bit resolution, 1 LSB = 0.00038% of FSR. For 16-bit resolution, 1 LSB = 0.0015% of FSR. For 14-bit resolution, 1 LSB = 0.006% of FSR. FSR stands for
Characteristics are guaranteed at V
T
Gain Error is measured with a fixed 50
Gain Error and gain drift are measured with the internal reference. The internal reference is the main contributor to the gain drift. If lower drift is required, the
DAC Gain Error is measured without the on-chip voltage reference. It represents the performance that can be obtained with an external precision reference.
External current is defined as the current available in addition to that supplied to REF IN and SPAN/BIPOLAR OFFSET on the AD760.
Operation on ±12 V supplies is possible using an external reference such as the AD586 and reducing the output range. Refer to the Internal/External Reference
CAL
(Time to +0.0008% FS, with
2 k , 1000 pF Load)
(Time to +0.0008% FS, with
100 pF Load)
A, S Grade
A, S Grade
A, S Grade
MAX
is the calibration temperature.
OUT
OUT
, V
CC
Recovery Time
Glitch Impulse
= +15 V, V
EE
= –15 V, V
OUT
Pin (23).
LL
resistor as shown in Figure 5a and Figure 6a.
= +5 V, tested at V
Limit
13
8
10
6
8
2.5
2
0.005
0.03
3.0
94
15
30
2
120
125
OUT
except where noted.)
Units
µs max
µs typ
µs typ
µs typ
µs typ
µs typ
µs typ
% max
% max
% max
dB min
nV-s typ
nV-s typ
nV-s typ
nV/ Hz typ
nV/ Hz typ
With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
–3–
Test Conditions/Comments
20 V Step, T
20 V Step, T
20 V Step
10 V Step, T
10 V Step
1 LSB Step
Recovery time is referenced to the rising edge of CALOK,
when MUX
MUX
MUX
0 dB, 1001 Hz. Sample Rate = 100 kHz. T
–20 dB, 1001 Hz. Sample Rate = 100 kHz. T
–60 dB, 1001 Hz. Sample Rate = 100 kHz. T
T
DAC alternately loaded with 8000
100 pF Load. MUX
DAC alternately loaded with 0000
Measured at V
Measured at REF OUT
A
= +25°C, byte load
IN
IN
, V
= V
OUT
OUT
OUT
A
A
A
= +25°C
= +25°C
= +25°C
OUT
= –10 V to +10 V
switches from MUX
prior to calibration.
, 20 V span, excludes internal reference
IN
= V
OUT
= negative full scale
H
H
and 7FFF
and FFFF
IN
to V
A
OUT
= +25°C
A
A
H
H
.
= +25°C
= +25°C
. CS high
MIN
AD760
< T
A