ADM708 Analog Devices, ADM708 Datasheet - Page 5
![no-image](/images/manufacturer_photos/0/0/56/analog_devices_sml.jpg)
ADM708
Manufacturer Part Number
ADM708
Description
3 V, Voltage Monitoring Microprocessor Supervisory Circuit
Manufacturer
Analog Devices
Datasheet
1.ADM706.pdf
(16 pages)
Specifications of ADM708
Batt-backup-flg
Yes
Product Description
3V, Voltage Monitoring Microprocessor Supervisory Circuit
Reset Threshold (v)
2.63,2.93,3.08,4.4
Min Reset Timeout (ms)
160
Reset Output-stage
Active-High/Push-Pull,Active-Low/Push-Pull
Backup-battery Switch
No
Chip Enable Gating
---
Typ Watchdog Timeout (ms)
n/a
Package
DIP,SOIC,SOP
Us Price 1000-4999
n/a
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
ADM708
Manufacturer:
TOKO
Quantity:
5 510
Company:
Part Number:
ADM708AN
Manufacturer:
AD
Quantity:
5 510
Company:
Part Number:
ADM708AN
Manufacturer:
Analog Devices Inc.
Quantity:
500
Part Number:
ADM708AR
Manufacturer:
ADI/亚德诺
Quantity:
20 000
Part Number:
ADM708AR-REEL
Manufacturer:
AMD
Quantity:
20 000
Part Number:
ADM708ARM-REEL
Manufacturer:
ADI/亚德诺
Quantity:
20 000
Part Number:
ADM708ARZ
Manufacturer:
ADI/亚德诺
Quantity:
20 000
Part Number:
ADM708ARZ-REEL
Manufacturer:
ADI/亚德诺
Quantity:
20 000
ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
V
All Other Inputs
Input Current
Digital Output Current
Power Dissipation, N-8 (PDIP)
Power Dissipation, R-8 (SOIC)
Operating Temperature Range
Lead Temperature (Soldering, 10 sec)
Storage Temperature Range
ESD Rating
CC
A
V
GND
θ
θ
Industrial (Version A)
Vapor Phase (60 sec)
Infrared (15 sec)
= 25°C unless otherwise noted.
CC
JA
JA
Thermal Impedance
Thermal Impedance
ADM706P/ADM706R/ADM706S/ADM706T, ADM708R/ADM708S/ADM708T
Rating
−0.3 V to +6 V
−0.3 V to V
20 mA
20 mA
20 mA
727 mW
135°C/W
470 mW
110°C/W
−40°C to +85°C
300°C
215°C
220°C
−65°C to +150°C
>4.5 kV
CC
+ 0.3 V
Rev. C | Page 5 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION