T8T STMicroelectronics, T8T Datasheet - Page 5

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T8T

Manufacturer Part Number
T8T
Description
8A Snubberless™ and logic level Triacs
Manufacturer
STMicroelectronics
Datasheet
T8T
Figure 7.
Figure 9.
Figure 11. Relative variation of critical rate of
2.0
2.0
1.5
1.5
1.0
1.0
0.5
0.5
0.0
0.0
1000
1000
6
5
4
3
2
1
0
100
100
25
-50
-50
10
10
(dl / dt) c [T j ] /
0.01
0.01
I H ,
I TSM (A), I²t (A²s)
pulse with width t <10 ms, and corresponding value of I²t
I L
dl /dt limitation: 50 A / µs
[T j ] / I H , I L [T j = 25 °C]
-25
-25
Non repetitive surge peak on-state
current for a sinusoidal
Relative variation of holding
current and latching current versus
junction temperature
decrease of main current versus
junction temperature
50
(dl / dt) c
p
0
0
0.10
0.10
[T j = 125 °C]
25
25
T j (°C)
75
50
50
1.00
1.00
T j initial = 25 °C
75
75
100
I TSM
typical values
I²t
I H
100
100
t p (ms)
Doc ID 16192 Rev 3
T j (°C)
10.00
10.00
I L
125
125
125
Figure 8.
Figure 10. Relative variation of static dV/dt
Figure 12. Relative variation of leakage
3.0
3.0
2.5
2.5
2.0
2.0
1.5
1.5
1.0
1.0
0.5
0.5
0.0
0.0
1.0E+00
7
6
5
4
3
2
1
0
1.0E-01
1.0E-02
1.0E-03
-50
-50
25
I GT , V GT [T j ] / I GT , V GT [T j = 25 °C]
dV / dt [T j ] /
I GT Q1-Q2-Q3
25
I DRM /I RRM [T j ; V DRM / V RRM ] / I DRM /I RRM
-25
-25
Relative variation of gate trigger
current and gate trigger voltage
versus junction temperature
immunity versus junction
temperature
current versus junction
temperature
I GT Q3
dV / dt
50
[T j = 125 °C; 600 V]
0
0
I GT Q1-Q2
50
[T j = 125 °C]
V DRM = V RRM = 400 V
T j (°C)
for different values of blocking voltage
25
25
75
75
V DRM = V RRM = 600 V
50
50
V DRM = V RRM = 200 V
75
75
V D = V R = 402 V
Characteristics
100
100
typical values
100
100
T j (°C)
T j (°C)
125
125
125
125
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