FAN5401 Fairchild Semiconductor, FAN5401 Datasheet - Page 5

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FAN5401

Manufacturer Part Number
FAN5401
Description
The FAN5401 combines a highly integrated switched-mode charger, to minimize single-cell Lithium-ion (Li-ion) charging time from a USB power source, and a boost regulator to power a USB peripheral from the battery
Manufacturer
Fairchild Semiconductor
Datasheet

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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above
the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended
exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum
ratings are stress ratings only.
Note:
3.
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating
conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend
exceeding them or designing to absolute maximum ratings.
Thermal Properties
Junction-to-ambient thermal resistance is a function of application and board layout. This data is measured with four-layer
2s2p boards in accordance to JEDEC standard JESD51. Special attention must be paid not to exceed junction temperature
T
© 2009 Fairchild Semiconductor Corporation
FAN5400 Family • Rev. 1.0.7
Symbol
Symbol
Symbol Parameter
V
J(max)
dV
BAT(MAX)
V
V
ESD
T
V
dV
V
STAT
T
T
T
T
V
dt
Lesser of 6.5V or V
BUS
STG
BUS
BUS
JA
JB
dt
BUS
O
L
A
J
J
I
at a given ambient temperature T
VBUS Voltage
STAT Voltage
PMID Voltage
SW, CSIN, VBAT, AUXPWR, DISABLE Voltage
Voltage on Other Pins
Maximum VBUS Slope above 5.5V when Boost or Charger are Active
Electrostatic Discharge
Protection Level
Junction Temperature
Storage Temperature
Lead Soldering Temperature, 10 Seconds
Junction-to-Ambient Thermal Resistance
Junction-to-PCB Thermal Resistance
Supply Voltage
Maximum Battery Voltage when Boost enabled
Negative VBUS Slew Rate during VBUS Short Circuit,
C
Ambient Temperature
Junction Temperature (see Thermal Regulation and Protection section)
MID
< 4.7F, see VBUS Short While Charging
I
+ 0.3V.
A
. For measured data, see Table 11.
Parameter
Parameter
Continuous
Pulsed, 100ms Maximum Non-Repetitive
Human Body Model per JESD22-A114
Charged Device Model per JESD22-C101
5
T
T
A
A
< 60°C
> 60°C
Min.
Min.
–1.4
–2.0
–0.3
–0.3
–0.3
–40
–65
–30
–30
4
2000
500
Typical
Max.
+120
Max.
+150
+150
+260
6.5
+85
20.0
16.0
4.5
60
20
7.0
7.0
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6
4
2
4
(3)
Units
Units
°C/W
°C/W
V/s
Unit
V/s
°C
°C
°C
°C
°C
V
V
V
V
V
V
V

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