1104R24M00000AF Vectron International, Inc., 1104R24M00000AF Datasheet - Page 7

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1104R24M00000AF

Manufacturer Part Number
1104R24M00000AF
Description
IC SMD CRYSTAL OSC. 24MHZ 5V 20FLATPACK
Manufacturer
Vectron International, Inc.
Datasheet
SIZE
A
5.3
5.4
5.4.1 Frequency-Temperature Slew. Frequency-Temperature Slew Test has been developed as
5.4.2 Burn-in Delta Frequency Aging (in Option D). The frequency measurement for burn-in
5.5
5.6
5.7
6.
6.1
CODE IDENT NO.
00136
Test Conditions. Unless otherwise stated herein, inspections are performed in accordance
with those specified in MIL-PRF-55310 and MIL-PRF-38534, in that order. Process
travelers identify the applicable methods, conditions and procedures to be used.
Examples of electrical test procedures that correspond to MIL-PRF-55310 requirements
are shown in Table 3.
Special Tests and Descriptions.
an indicator of higher than normal internal water vapor content. The incremental
temperature sweep from +125°C to -55°C and back to +125°C records output frequency
fluctuations emulating the mass loading of moisture deposited on the crystal blank
surface. Though not replacing a customer s internal water-vapor content (RGA)
requirement, confidence is increased without destructively testing otherwise good
devices.
delta measurements is performed at the crystal s upper turning point temperature where
its effects on repeatable frequency accuracy are maximized. Dependent on the crystal
specified, this temperature is typically between +65°C and +85°C, ±0.2°C.
Deliverable Data. The manufacturer supplies the following data, as a minimum, with
each lot of devices:
Discrepant Material. All MRB authority resides with the procuring activity.
Failure Analysis. Any catastrophic failure (no clocking, no current) at Post Burn-In or
after will be evaluated for root cause. The customer will be notified after occurrence and
upon completion of the evaluation.
PREPARATION FOR DELIVERY
Packaging. Devices will be packaged in a manner that prevents handling and transit
damage during shipping. Devices will be handled in accordance with MIL-STD-1686 for
Class 1 devices.
a. Completed assembly and screening lot travelers, including rework history.
b. Electrical test variables data, identified by unique serial number.
c. Frequency-Temperature Slew plots, Radiographic films, Group C data and RGA
data as required by purchase order.
UNSPECIFIED TOLERANCES
N/A
OS-68338
DWG NO.
REV.
G
SHEET
7

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