NCV8664 ON Semiconductor, NCV8664 Datasheet - Page 2

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NCV8664

Manufacturer Part Number
NCV8664
Description
5.0v, 3.3v/150ma Very Low Quiescent Current Ldo
Manufacturer
ON Semiconductor
Datasheet

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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. This device series incorporates ESD protection and is tested by the following methods:
2. 1 oz., 100 mm
PIN FUNCTION DESCRIPTION
OPERATING RANGE
MAXIMUM RATINGS
Thermal Resistance
Junction-to-Ambient
Junction-to-Ambient
Junction-to-Case
Junction-to-Case
Pin No.
V
Junction Temperature Operating Range
V
V
Storage Temperature
ESD Capability, Human Body Model (Note 1)
ESD Capability, Machine Model (Note 1)
IN
IN
OUT
TAB
ESD HBM tested per AEC-Q100-002 (EIA/JESD22-A 114C)
ESD MM tested per AEC-Q100-003 (EIA/JESD22-A 115C)
1
2
3
,
,
DC Input Operating Voltage
DC Voltage
, DC Voltage
2
Symbol
Parameter
copper area.
GND
V
GND
V
OUT
IN
IN
Pin Symbol, Parameter
Reference
SOT-223
SOT-223
1.3 V
Rating
Unregulated input voltage; 4.5 V to 45 V.
Ground; substrate.
Regulated output voltage; collector of the internal PNP pass transistor.
Ground; substrate and best thermal connection to the die.
DPAK
DPAK
Bias Current
Generators
Error
Amp
+
-
Figure 1. Block Diagram
Symbol
R
R
R
R
qJA
qJA
qJC
qJC
http://onsemi.com
Shutdown
Thermal
NCV8664
2
Condition
Function
V
Symbol
Symbol
V
ESDMIM
V
ESDHB
T
V
V
T
OUT
stg
IN
IN
J
Min
-
-
-
-
4000
-0.3
Min
Min
-40
-42
-55
200
4.5
OUT
GND
101 (Note 2)
99 (Note 2)
+150
+150
Max
Max
+45
+45
+16
-
-
Max
9.0
17
Unit
Unit
_C
_C
V
V
V
V
V
°C/W
°C/W
°C/W
°C/W
Unit

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