TISP61089BSD Bourns, Inc., TISP61089BSD Datasheet - Page 12

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TISP61089BSD

Manufacturer Part Number
TISP61089BSD
Description
Dual Forward-conducting P-gate Thyristors Programmable Overvoltage Protectors
Manufacturer
Bourns, Inc.
Datasheet
The exception to these two conditions of independence and limit waveshape values is the alternative IEEE C.62.41, 1.2/50-8/20 combination
wave generator, which may be used for testing in ‘1089 Sections 4.5.7, 4.5.8 and 4.5.9. Here, the quoted waveshape values are nominal with
defined tolerance. The open-circuit voltage waveshape is 1.2 µs ±0.36 µs front time and 50 µs ±10 µs duration. The short-circuit current
waveshape is 8 µs +1.0 µs, -2.5 µs front time and 20 µs +8 µs, -4 µs duration. The generator fictive source impedance (peak open-circuit
voltage divided by peak short-circuit current) is 2.0 Ω ±0.25 Ω.
To get the same peak short-circuit currents as the 2/10 generator, for the same peak open-circuit voltage setting, ‘1089 specifies that the
1.2/50-8/20 generator be used with external resistors for current limiting and sharing. When working into a finite resistive load the delivered
1.2/50-8/20 generator current waveshape moves towards the 1.2/50 voltage waveshape. Thus, although the 1.2/50-8/20 delivered peak current
is similar to the 2/10 generator, the much longer current duration means that a much higher stress is imposed on the equipment protection
circuit. This can cause fuses to operate which are perfectly satisfactory on the normal 2/10 generator. Testing with the 1.2/50-8/20 generator
gives higher stress levels than the 2/10 generator and, because it is little used, will not be covered in this analysis.
‘1089 Section 4.5.5 - Test Generators (Continued)
TISP61089BSD High Voltage Ringing SLIC Protector
Figure 15. Transverse (also Called Differential or Metallic) Testing
Figure 14. Longtitudinal (also Called Common Mode) Testing
Test Generator
Test Generator
Test Generator
Output 1
Output 2
Output 1
Output 2
Output 1
Output 2
Return
Return
Return
V1
V1
V2
V2
Ring
Tip
Ground
Ring
Tip
Ground
Ring
Tip
Ground
Customers should verify actual device performance in their specific applications.
Under Test)
(Equipment
Under Test)
(Equipment
Under Test)
(Equipment
EUT
EUT
EUT
AI6XCM
AI6XCK
Specifications are subject to change without notice.
SEPTEMBER 2005 - REVISED MAY 2007

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