UMP-5-5-Q12 C&D Technologies., UMP-5-5-Q12 Datasheet - Page 8

• Manufacturer Part Number: UMP-5-5-Q12
• Description: 25-40w, Single Output, Dc/dc Converters
• Manufacturer: C&D Technologies.

Quality and Reliability
These models are the latest DC/DC Converters to emerge from DATEL’s new,
company-wide approach to designing and manufacturing the most reliable
power converters available. The five-pronged program draws our Quality
Assurance function into all aspects of new-product design, development,
characterization, qualification and manufacturing.
Design for Reliability
Design for Reliability is woven throughout our multi-phased, new-product-de-
velopment process. Design-for-reliability practices are fully documented and
begin early in the new-product development cycle with the following goals:
1. To work from an approved components/vendors list ensuring the use of
reliable components and the rigorous qualification of new components.
2. To design with safety margins by adhering to a strict set of derating
guidelines and performing theoretical worst-case analyses.
3. To locate potential design weaknesses early in the product-development
cycle by using extensive HALT (Highly Accelerated Life Testing).
4. To prove that early design improvements are effective by employing a
thorough FRACA (Failure Reporting Analysis and Corrective Action) system.
HaLT Testing
The goal of the accelerated-stress techniques used by DATEL is to force
device maturity, in a short period of time, by exposing devices to excessive
levels of "every stimulus of potential value." We use HALT (Highly Acceler-
ated Life Testing) repeatedly during the design and early manufacturing
phases to detect potential electrical and mechanical design weaknesses
that could result in possible future field failures.
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During HALT, prototype and pre-production DC/DC converters are subjected
to progressively higher stress levels induced by thermal cycling, rate of
temperature change, vibration, power cycling, product-specific stresses
(such as dc voltage variation) and combined environments. The stresses are
not meant to simulate field environments but to expose any weaknesses in a
product’s electro/mechanical design and/or assembly processes. The goal
of HALT is to make products fail so that device weaknesses can be analyzed
and strengthened as appropriate. Applied stresses are continually stepped
up until products eventually fail. After corrective actions and/or design
changes, stresses are stepped up again and the cycle is repeated until the
"fundamental limit of the technology" is determined.
DATEL has invested in a Qualmark OVS-1 HALT tester capable of applying
voltage and temperature extremes as well as 6-axis, linear and rotational,
random vibration. A typical HALT profile (shown above) consists of thermal
cycling (–55 to +125°C, 30°C/minute) and simultaneous, gradually increas-
ing, random longitudinal and rotational vibration up to 20G’s with load cycling
and applied-voltage extremes added as desired. Many devices in DATEL’s
new A-Series could not be made to fail prior to reaching either the limits of
the HALT chamber or some previously known physical limit of the device.
We also use the HALT chamber and its ability to rapidly cool devices to verify
their "cold-start" capabilities.
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–40
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Technical enquiries email: [e-mail], tel:
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25-40W, Single Output, DC/DC Converters
Typical HaLT Profile
Test Time (minutes)
40
50
60
MDC_UMP25-40W_B01 Page 8 of 9
UMP Models
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[phone]
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