NE27200 Renesas Electronics Corporation., NE27200 Datasheet

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NE27200

Manufacturer Part Number
NE27200
Description
C To Ka Band Super Low Noise Amplifier N-channel Hj-fet Chip
Manufacturer
Renesas Electronics Corporation.
Datasheet
Document No. P11512EJ2V0DS00 (2nd edition)
Date Published January 1997 N
Printed in Japan
DESCRIPTION
and undoped InGaAs to create high mobility electrons. Its excellent low noise and high associated gain make it suitable
for commercial systems, industrial and space applications.
FEATURES
• Super Low Noise Figure & High Associated Gain
• Gate Length : L
• Gate Width : W
ORDERING INFORMATION
ABSOLUTE MAXIMUM RATINGS (T
ELECTRICAL CHARACTERISTICS (T
NE32500
NE27200
Gate to Source Leak Current
Saturated Drain Current
Gate to Source Cutoff Voltage
Transconductance
Thermal Resistance
Noise Figure
Associated Gain
* Chip mounted on a Alumina heatsink (size: 3
NE32500 and NE27200 are Hetero Junction FET chip that utilizes the hetero junction between Si-doped AlGaAs
Drain to Source Voltage
Gate to Source Voltage
Drain Current
Total Power Dissipation
Channel Temperature
Storage Temperature
RF performance is determined by packaging and testing 10 chips per wafer.
Wafer rejection criteria for standard devices is 2 rejects per 10 samples.
NF = 0.45 dB TYP., G
PART NUMBER
PARAMETER
C to Ka BAND SUPER LOW NOISE AMPLIFIER
g
g
= 0.2 m
= 200 m
a
HETERO JUNCTION FIELD EFFECT TRANSISTOR
= 12.5 dB TYP. at f = 12 GHz
Standard (Grade D)
Special, specific (Grade C and B)
SYMBOL
V
I
I
R
GS(off)
NF
GSO
G
DSS
g
th
m
a
N-CHANNEL HJ-FET CHIP
*
DATA SHEET
MIN.
–0.2
11.0
P
V
V
A
T
T
20
45
I
tot
A
DS
GS
stg
D
ch
= 25 ˚C)
*
= 25 ˚C)
NE32500, NE27200
QUALITY GRADE
TYP.
3
–0.7
0.45
12.5
0.5
60
60
0.6
t
)
–65 to +175
MAX.
–2.0
0.55
260
10
90
–3.0
I
200
175
4.0
DSS
UNIT
˚C/W
mA
mS
dB
dB
V
A
V
V
V
V
channel to case
V
GS
DS
DS
DS
DS
= –3 V
= 2 V, V
= 2 V, I
= 2 V, I
= 2 V, I
mW
mA
V
V
C
C
TEST CONDITIONS
D
D
D
GS
= 100 A
= 10 mA
= 10 mA, f = 12 GHz
= 0 V
©
1996

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NE27200 Summary of contents

Page 1

... BAND SUPER LOW NOISE AMPLIFIER DESCRIPTION NE32500 and NE27200 are Hetero Junction FET chip that utilizes the hetero junction between Si-doped AlGaAs and undoped InGaAs to create high mobility electrons. Its excellent low noise and high associated gain make it suitable for commercial systems, industrial and space applications. ...

Page 2

... Ambient Temperature – ˚ 5.5 58 36.5 66 Drain Source Source Gate 350 ˚C) A DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE 100 200 250 0 V – Drain to Source Voltage – NE32500, NE27200 –0.2 V –0.4 V –0.6 V –0.8 V 1.5 3.0 ...

Page 3

... Gate to Source Voltage – NOISE FIGURE, ASSOCIATED GAIN vs. DRAIN CURRENT GHz 20 16 2.0 12 1.5 1 NE32500, NE27200 – Drain Current – ...

Page 4

... NE32500, NE27200 S 22 MAG. ANG. (deg.) 0.564 –3 0.562 –6 0.559 –11 0.557 –17 0.551 –23 0.546 –29 0.539 –34 0.533 –40 0.526 –44 0.519 –49 0.508 –54 0.503 – ...

Page 5

... The Great Care must be taken in dealing with the devices in this guide. The reason is that the material of the devices is GaAs (Gallium Arsenide), which is designated as harmful substance according to the law concerned. Keep the law concerned and so on, especially in case of removal. NE32500, NE27200 CAUTION 5 ...

Page 6

... NE32500, NE27200 ...

Page 7

... NE32500, NE27200 7 ...

Page 8

... The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product. NE32500, NE27200 M4 96.5 ...

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