MBM29LV001TC Fujitsu Microelectronics, Inc., MBM29LV001TC Datasheet - Page 27

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MBM29LV001TC

Manufacturer Part Number
MBM29LV001TC
Description
1m 128k X 8 Bit
Manufacturer
Fujitsu Microelectronics, Inc.
Datasheet
Note: Test Conditions:
JEDEC
• Read Only Operations Characteristics
AC CHARACTERISTICS
t
t
t
t
t
t
t
AVQV
GLQV
EHQZ
GHQZ
AXQX
ELQV
AVAV
Parameter
Symbols
Output Load: 1 TTL gate and 30 pF (MBM29LV001TC/BC-55)
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Standard
Output:1.5 V
t
Input: 1.5 V
READY
t
Notes: C
t
t
t
t
t
t
ACC
OH
RC
CE
OE
DF
DF
1 TTL gate and 100 pF (MBM29LV001TC/BC-70)
C
L
L
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From
Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
= 30 pF including jig capacitance (MBM29LV001TC/BC-55)
= 100 pF including jig capacitance (MBM29LV001TC/BC-70)
MBM29LV001TC
Device
Description
Under
Test
Figure 4
C
L
Test Conditions
CE = V
OE = V
OE = V
-55/-70
Test Setup
IN3064
or Equivalent
6.2 k
IL
IL
IL
/MBM29LV001BC
Max.
Max.
Max.
Max.
Max.
Max.
Min.
Min.
3.3 V
2.7 k
(Note)
-55
55
55
55
30
15
15
20
0
Diodes = IN3064
or Equivalent
(Note)
-70
70
70
70
30
25
25
20
0
-55/-70
Unit
ns
ns
ns
ns
ns
ns
ns
s
27

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