MBM29LV002TC Fujitsu Microelectronics, Inc., MBM29LV002TC Datasheet - Page 28

• Manufacturer Part Number: MBM29LV002TC
• Description: 2m 256k X 8 Bit
• Manufacturer: Fujitsu Microelectronics, Inc.

28
MBM29LV002TC
Note: Test Conditions:
JEDEC
• Read Only Operations Characteristics
AC CHARACTERISTICS
t
t
t
t
t
t
t
AVQV
GLQV
EHQZ
GHQZ
AXQX
ELQV
AVAV
—
Parameter
Symbols
Output Load: 1 TTL gate and 30 pF (MBM29LV002TC/BC-70)
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Standard
Output:1.5 V
Input: 1.5 V
t
Notes: C
READY
t
t
t
t
t
t
t
ACC
RC
CE
OE
DF
DF
OH
1 TTL gate and 100 pF (MBM29LV002TC/BC-90/-12)
C
L
L
= 30 pF including jig capacitance (MBM29LV002TC/BC-70)
= 100 pF including jig capacitance (MBM29LV002TC/BC-90/-12)
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From
Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
Device
-70/-90/-12
Under
Test
Description
Figure 4
C
/MBM29LV002BC
L
Test Conditions
CE = V
OE = V
OE = V
IN3064
or Equivalent
Test Setup
6.2 k
—
—
—
—
—
—
IL
IL
IL
Max.
Max.
Max.
Max.
Max.
Max.
Min.
Min.
3.3 V
2.7 k
(Note)
-70
70
70
70
30
25
25
20
0
-70/-90/-12
Diodes = IN3064
or Equivalent
(Note)
-90
90
90
90
35
30
30
20
0
(Note)
120
120
120
-12
50
30
30
20
0
Unit
ns
ns
ns
ns
ns
ns
ns
s