ACS03D Intersil Corporation, ACS03D Datasheet
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ACS03D
Manufacturer Part Number
ACS03D
Description
Radiation Hardened Quad 2-input NAND Gate With Open Drain
Manufacturer
Intersil Corporation
Datasheet
1.ACS03D.pdf
(4 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
January 1996
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
Features
• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are Contained in
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10
• SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm
• Dose Rate Upset . . . . . . . . . . . . . . . . >10
• Dose Rate Survivability . . . . . . . . . . . >10
• Latch-Up Free Under Any Conditions
• Military Temperature Range . . . . . . . . . . . . . . . . . . -55
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
• Input Logic Levels
• Input Current
• Fast Propagation Delay . . . . . . . . . . . . . . . . 15ns (Max), 10ns (Typ)
Description
The Intersil ACS03MS is a Radiation Hardened quad 2-input NAND gate
with open drain outputs. The open drain output can drive resistive loads
from a separate supply voltage.
The ACS03MS utilizes advanced CMOS/SOS technology to achieve
high-speed operation. This device is a member of a radiation hardened,
high-speed, CMOS/SOS Logic Family.
The ACS03MS is supplied in a 14 lead Ceramic Flatpack (K suffix) or a
Ceramic Dual-In-Line Package (D suffix).
Ordering Information
5962F9670301VCC
5962F9670301VXC
ACS03D/Sample
ACS03K/Sample
ACS03HMSR
SMD# 5962-96703 and Intersil’s QM Plan
(Typ)
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
PART NUMBER
1 A at VOL, VOH
|
TEMPERATURE RANGE
Copyright
-55
-55
o
o
C to +125
C to +125
25
25
25
©
o
o
o
Intersil Corporation 1999
C
C
C
11
12
o
o
C
C
RAD (Si)/s, 20ns Pulse
RAD (Si)/s, 20ns Pulse
-10
MIL-PRF-38535 Class V
MIL-PRF-38535 Class V
Sample
Sample
Die
Errors/Bit/Day
o
C to +125
1
SCREENING LEVEL
2
/mg
o
Radiation Hardened Quad 2-Input
C
Pinouts
ACS03MS
GND
NAND Gate with Open Drain
MIL-STD-1835 DESIGNATOR CDFP3-F14,
MIL-STD-1835 DESIGNATOR CDIP2-T14,
A1
B1
A2
B2
Y1
Y2
14 PIN CERAMIC DUAL-IN-LINE
GND
14 PIN CERAMIC FLATPACK
A1
B1
A2
B2
Y1
Y2
1
2
3
4
5
6
7
14 Lead SBDIP
14 Lead Ceramic Flatpack
14 Lead SBDIP
14 Lead Ceramic Flatpack
Die
LEAD FINISH C
LEAD FINISH C
1
2
3
4
5
6
7
TOP VIEW
TOP VIEW
Spec Number
PACKAGE
File Number
14
13
12
11
10
9
8
14
13
12
10
11
9
8
VCC
B4
A4
Y4
B3
A3
Y3
VCC
B4
A4
Y4
B3
A3
Y3
518779
3064.1