LM50C National Semiconductor, LM50C Datasheet - Page 2

• Manufacturer Part Number: LM50C
• Description: (LM50B / LM50C) SOT-23 Single-Supply Centigrade Temperature Sensor
• Manufacturer: National Semiconductor

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Accuracy
(Note 6)
Nonlinearity (Note 7)
Sensor Gain
(Average Slope)
Output Resistance
Line Regulation
(Note 8)
Quiescent Current
(Note 9)
Change of Quiescent
Current (Note 8)
Temperature Coefficient of
Quiescent Current
Long Term Stability (Note 10)
Absolute Maximum Ratings
Supply Voltage
Output Voltage
Output Current
Storage Temperature
Lead Temperature
T
Electrical Characteristics
Note 1 Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions
Note 2 See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
Note 3 Human body model 100 pF discharged through a 1 5 k
Note 4 Thermal resistance of the SOT-23 package is specified without a heat sink junction to ambient
Note 5 Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 6 Accuracy is defined as the error between the output voltage and 10mv C times the device’s case temperature at specified conditions of voltage current
and temperature (expressed in C)
Note 7 Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range
Note 8 Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance
Note 9 Quiescent current is defined in the circuit of Figure 1
Note 10 For best long-term stability any precision circuit will give best results if the unit is aged at a warm temperature and or temperature cycled for at least 46
hours before long-term life test begins This is especially true when a small (Surface-Mount) part is wave-soldered allow time for stress relaxation to occur The
majority of the drift will occur in the first 1000 hours at elevated temperatures The drift after 1000 hours will not continue at the first 1000 hour rate
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SOT Package (Note 2)
0 5 A in the circuit of Figure 1 Boldface limits apply for the specified T
T
Vapor Phase (60 seconds)
Infrared (15 seconds)
J
e a
Maximum Junction Temperature
Parameter
25 C unless otherwise noted
T
T
T
T
a
a
a
A
A
A
J
(
1000 hours
4 5V
4 5V
4 5V
a
e
e a
e
e
V
Conditions
125 C for
T
T
S
MAX
MIN
s
s
s
b
25 C
a
V
V
V
65 C to
Unless otherwise noted these specifications apply for V
a
0 6V) to
S s
S s
S s
12V to
(Note 1)
a
a
a
a
10V
10V
10V
resistor Machine model 200 pF discharged directly into each pin
b
b
10 mA
150 C
215 C
220 C
150 C
0 2V
1 0V
Typical
a
g
2000
0 08
2
1 0
ESD Susceptibility (Note 3)
Operating Ratings
Specified Temperature Range
Operating Temperature Range
Supply Voltage Range (
JA
LM50B
Human Body Model
Machine Model
LM50C
LM50B
(Note 4)
a
(Note 5)
a
3 0
4000
g
a
g
Limit
g
g
g
180
130
2 0
10 3
0 8
9 7
1 2
2 0
3 0
0 8
b
3 5
A
e
T
J
Typical
g
a
2000
e
a
0 08
2 0
V
T
S
MIN
)
LM50C
(Note 1)
to T
S
(Note 5)
e a
a
4000
a
g
g
Limit
g
g
g
g
180
2 0
MAX
130
10 3
0 8
9 7
1 2
3 0
4 0
4 0
0 8
5 V
b
b
b
all other limits T
DC
40 C to
25 C to
40 C to
a
4 5V to
T
and I
mV C (max)
MIN
mV C (min)
mV V (max)
mV V (max)
450 C W
C (max)
C (max)
C (max)
C (max)
(Limit)
A (max)
A (max)
A (max)
Units
a
a
a
LOAD
to T
A C
(max)
2000V
125 C
100 C
150 C
a
C
200V
MAX
10V
e
A