SD834-04-TE12R Fuji Electric holdings CO.,Ltd, SD834-04-TE12R Datasheet - Page 4

• Manufacturer Part Number: SD834-04-TE12R
• Description: Silicon Diode
• Manufacturer: Fuji Electric holdings CO.,Ltd

Fuji Electric Device Technology Co.,Ltd.
5. TEST AND INSPECTION
5.1 STANDARD TEST CONDITION
5.2 STRUCTURE INSPECTION
5.3 FORWARD AND REVERSE CHARACTERISTICS
5.4 TEST
Standard test condition is Ta=25℃、65%R.H.
If judgment is no doubt, the test condition is possible to test in normal condition
Ta=5～35℃、48～85%R.H.
It inspect with eye and measure, Item 2 shall be satisfied.
It inspect on the standard condition, Item 4.2 shall be satisfied.
Test
No.
1
2
3
4
Vibration
Shock
Solder ability
Resistance to
Soldering Heat 1
(Flow)
Resistance to
Soldering Heat 2
(Reflow)
Items
Test
Frequency : 100Hz to 2kHz
Acceleration : 100m/s
Sweeping time : 4min./1 cycle
4times for each X, Y&Z directions.
Peak amplitude : 15km/s
Duration time : 0.5ms
3times for each X, Y&Z directions.
Solder : Sn-3Ag-0.5Cu
Solder temp. : 245±5℃
Immersion time : 5±0.5s
Apply to flux
Solder temp.:260±5℃
Immersion time : 10±1s
Number of times:1time
(Preparation)
Baking treatment:125±5℃,24hr
Humidification treatment:
Solder temp.:250±5℃
Immersion time : 10±1s
Solder temperature maximum:255℃
(230℃ or more are processed within in
30sec.)
Number of times:2times
I
(Preparation)
Baking treatment:125±5℃,24hr
Humidification treatment:
R
-ray Reflowing
Testing methods and Conditions
85±2℃,85±5%RH,72±2hr
85±2℃,85±5%RH,168hr
2
2
A-121
A-122
test code D
(A-131A)
A-133A
Ⅲ-B
(A-133A)
(Ⅰ-A)
EIAJ ED4701
MS5D2342
Reference
Standard
Sampling
number
5
5
5
5
5
4/12
Acceptance
H04-004-03a
number
(0 : 1)