AT93C46-10C ATMEL Corporation, AT93C46-10C Datasheet - Page 2

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AT93C46-10C

Manufacturer Part Number
AT93C46-10C
Description
1k (128x8 or 64x16),2k (256x8 or 128x16),4k (512x8 or 256x16) 3-wire Serial EePROMs
Manufacturer
ATMEL Corporation
Datasheet
The AT93C46/56/66 is enabled through the Chip Select pin (CS), and accessed via a 3-wire serial interface consisting of
Data Input (DI), Data Output (DO), and Shift Clock (SK). Upon receiving a READ instruction at DI, the address is decoded
and the data is clocked out serially on the data output pin DO. The WRITE cycle is completely self-timed and no separate
ERASE cycle is required before WRITE. The WRITE cycle is only enabled when the part is in the ERASE/WRITE ENABLE
state. When CS is brought “high” following the initiation of a WRITE cycle, the DO pin outputs the READY/BUSY status of
the part.
The AT93C46/56/66 is available in 2.7V to 5.5V and 1.8V to 5.5V versions.
Absolute Maximum Ratings*
Block Diagram
Note:
2
Operating Temperature.................................. -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
Voltage on Any Pin
with Respect to Ground .....................................-1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
1. When the ORG pin is connected to VCC, the x 16 organization is selected. When it is connected to ground, the x 8 organiza-
2. For the AT93C46, if x 16 organization is the mode of choice and Pin 6 (ORG) is left unconnected, Atmel recommends using
AT93C46/56/66
tion is selected. If the ORG pin is left unconnected and the application does not load the input beyond the capability of the
internal 1 Meg ohm pullup, then the x 16 organization is selected. The feature is not available on the 1.8V devices.
the AT93C46A device. For more details, see the AT93C46A datasheet.
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
0172S–SEEPR–01/03

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