AT93C46-10TC ATMEL Corporation, AT93C46-10TC Datasheet - Page 2

• Manufacturer Part Number: AT93C46-10TC
• Description: 3-wire Serial EePROMs
• Manufacturer: ATMEL Corporation

The AT93C46/56/57/66 is enabled through the Chip Select
pin (CS), and accessed via a 3-wire serial interface consist-
ing of Data Input (DI), Data Output (DO), and Shift Clock
(SK). Upon receiving a READ instruction at DI, the address
is decoded and the data is clocked out serially on the data
output pin DO. The WRITE cycle is completely self-timed
and no separate ERASE cycle is required before WRITE.
The WRITE cycle is only enabled when the part is in the
Absolute Maximum Ratings*
Block Diagram
Note:
2
Operating Temperature .................................. -55 C to +125 C
Storage Temperature ..................................... -65 C to +150 C
Voltage on Any Pin
with Respect to Ground .....................................-1.0V to +7.0V
Maximum Operating Voltage........................................... 6.25V
DC Output Current........................................................ 5.0 mA
1.
AT93C46/56/57/66
When the ORG pin is connected to V
tion is selected. If the ORG pin is left unconnected, then an internal pullup device (of approximately 1 M ) will select the x
16 organization. This feature is not available on 1.8V devices.
CC
, the x 16 organization is selected. When it is connected to ground, the x 8 organiza-
ERASE/WRITE ENABLE state. When CS is brought “high”
following the initiation of a WRITE cycle, the DO pin out-
puts the READY/BUSY status of the part.
The AT93C46 is available in 4.5V to 5.5V, 2.7V to 5.5V,
2 . 5 V t o 5 . 5 V , a n d 1 . 8 V t o 5 . 5 V v e r s i o n s . T h e
AT93C56/57/66 is available in 4.5V to 5.5V, 2.7V to 5.5V,
and 2.5V to 5.5V versions.
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability