SST39VF400A Silicon Storage Technology, SST39VF400A Datasheet - Page 12

• Manufacturer Part Number: SST39VF400A
• Description: (SST39xF200A/400A/800A) 2 Mbit / 4 Mbit / 8 Mbit (x16) Multi-Purpose Flash
• Manufacturer: Silicon Storage Technology

TABLE 10: DC O
TABLE 11: R
TABLE 12: C
TABLE 13: R
©2001 Silicon Storage Technology, Inc.
Symbol
I
I
I
I
V
V
V
V
V
Symbol
T
T
Parameter
C
C
Symbol
N
T
I
DD
SB
LI
LO
LTH
PU-READ
PU-WRITE
DR
IL
IH
IHC
OL
OH
I/O
IN
END
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1
1
1
1
1
1
1
Parameter
Power Supply Current
Read
Program and Erase
Standby V
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Input High Voltage (CMOS)
Output Low Voltage
Output High Voltage
V
DD
ECOMMENDED
APACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
ELIABILITY
= 3.0-3.6V
PERATING
Parameter
Power-up to Read Operation
Power-up to Program/Erase Operation
Description
I/O Pin Capacitance
Input Capacitance
Parameter
Endurance
Data Retention
Latch Up
DD
Current
C
HARACTERISTICS
C
S
FOR
YSTEM
HARACTERISTICS
SST39LF200A/400A/800A
P
OWER
-
UP
V
V
0.7V
DD
DD
Min
T
-0.3
-0.2
IMINGS
DD
SST39VF200A / SST39VF400A / SST39VF800A
SST39LF200A / SST39LF400A / SST39LF800A
Limits
Minimum Specification
2 Mbit / 4 Mbit / 8 Mbit Multi-Purpose Flash
Max
0.8
0.2
30
30
20
10
12
1
100 + I
10,000
AND
Units
100
mA
mA
µA
µA
µA
V
V
V
V
2.7-3.6V
DD
Test Conditions
Address input = V
V
CE#=OE#=V
CE#=WE#=V
CE#=V
V
V
V
V
V
I
I
OL
OH
OUT
DD
IN
DD
DD
DD
= 100 µA, V
=GND to V
= -100 µA, V
=V
= V
= V
= V
=GND to V
DD
FOR
IHC
DD
DD
DD
Max.
, V
Min.
Max.
Max.
SST39VF200A/400A/800A
Test Condition
Cycles
Units
Years
DD
IL
IL
mA
,WE#=V
, OE#=V
DD
Minimum
DD
V
V
= V
DD
DD
I/O
, V
IN
IL
100
100
= V
, V
/V
DD
= V
= 0V
DD
= 0V
IH
DD
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
DD
Max.
IH
= V
DD
, at f=1/T
IH
, all I/Os open
= V
Min.
Min.
DD
DD
Max.
S71117-04-000 6/01
Max.
RC
Maximum
Min.,
Units
12 pF
Data Sheet
6 pF
µs
µs
T10.5 360
T11.0 360
T12.0 360
T13.1 360
360