SSTU32864 Philips Semiconductors, SSTU32864 Datasheet - Page 11

• Manufacturer Part Number: SSTU32864
• Description: 1.8V confgurable registered buffer
• Manufacturer: Philips Semiconductors

Philips Semiconductors
10. Test information
9397 750 13339
Objective data
10.1 Test circuit
All input pulses are supplied by generators having the following characteristics:
PRR
specified.
The outputs are measured one at a time with one transition per measurement.
Fig 5. Load circuit.
Fig 6. Voltage and current waveforms; inputs active and inactive times.
Fig 7. Voltage waveforms; pulse duration.
CK INPUTS
(1) C
I
V
V
V
DD
ID
IH
IL
10 MHz; Z
= V
tested with clock and data inputs held at V
= 600 mV
= V
L
REF
includes probe and jig capacitance.
REF
1.8 V configurable registered buffer for DDR2 RDIMM applications
+ 250 mV (AC voltage levels) for differential inputs. V
TEST POINT
TEST POINT
R L = 100
250 mV (AC voltage levels) for differential inputs. V
RESET
o
INPUT
LVCMOS
Rev. 01 — 12 July 2004
= 50 ; input slew rate = 1 V/ns
(SEE NOTE)
T L = 50
I DD
V DD /2
t inact
V ICR
CK
CK
10%
DUT
DD
OUT
t W
or GND, and I
T L = 350 ps, 50
V DD /2
20%, unless otherwise
© Koninklijke Philips Electronics N.V. 2004. All rights reserved.
V ICR
o
IL
t act
IH
= 0 mA.
= GND for LVCMOS inputs.
= V
SEE NOTE (1)
V DD
0 V
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SSTU32864
C L = 30 pF
DD
V ID
90%
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for LVCMOS inputs.
V IH
V IL
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V DD
R L = 1000
R L = 1000
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