25C320 MicrochipTechnology, 25C320 Datasheet - Page 2

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25C320

Manufacturer Part Number
25C320
Description
32K5.0VSPIBusSerialEEPROM
Manufacturer
MicrochipTechnology
Datasheet

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25C320
1.0
1.1
V
All inputs and outputs w.r.t. V
Storage temperature ............................ -65 C to 150 C
Ambient temperature under bias.......... -65 C to 125 C
Soldering temperature of leads
(10 seconds) .................................................... +300 C
ESD protection on all pins..................................... 4 kV
*Notice: Stresses above those listed under ‘Maximum ratings’
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at those or any
other conditions above those indicated in the operational listings
of this specification is not implied. Exposure to maximum rating
conditions for extended period of time may affect device reliability
TABLE 1-1:
TABLE 1-2:
DS21159B-page 2
Applicable over recommended operating ranges shown below unless otherwise noted:
V
Commercial (C):
Industrial (I):
Automotive (E):
High level input voltage
Low level input voltage
Low level output voltage
High level output voltage
Input leakage current
Output leakage current
Internal Capacitance
(all inputs and outputs)
Operating Current
Standby Current
Note:
CC
CC
Name
HOLD
........................................................................ 7.0V
SCK
V
WP
V
CS
SO
NC
= 4.5V to 5.5V
SI
SS
CC
This parameter is periodically sampled and not 100% tested.
ELECTRICAL
CHARACTERISTICS
Maximum Ratings*
Parameter
Chip Select Input
Serial Data Output
Serial Data Input
Serial Clock Input
Write Protect Pin
Ground
Supply Voltage
Hold Input
No Connect
PIN FUNCTION TABLE
DC CHARACTERISTICS
Tamb = 0 C to +70˚C
Tamb =-40˚C to +85˚C
Tamb = -40 C to +125 C
SS
Function
C
I
V
V
V
V
I
I
I
I
LI
LO
CC write
CC read
CCS
....... -0.6V to V
IH
IL
OL
OH
INT
Symbol
CC
V
CC
——
-0.3
Min
2.0
-10
-10
+1.0V
-0.5
Preliminary
V
Max
CC
0.8
0.4
10
10
7
5
1
5
FIGURE 1-1: AC TEST CIRCUIT
1.2
AC Waveform:
Timing Measurement Reference Level
Note 1: For V
+1
V
V
V
Input
Output
LO
HI
HI
2: For V
V
V
pF
mA
mA
V
V
SO
= Vcc - 0.2V
= 4.0V
Units
A
A
A
= 0.2V
AC Test Conditions
CC
CC
I
I
CS=V
CS=V
Tamb=25 C, F
V
V
V
CS=V
Vcc
OL
OH
CC
CC
CC
> 4.0V
=2.1 mA
=-400 A
4.0V
=5.5V (Note)
=5.5V; SO=Open
=5.5V; SO=Open, F
2.25 K
1.8 K
IH
IH
CC
, V
, V
=5.5V; V
1996 Microchip Technology Inc.
Test Conditions
IN
OUT
(Note 1)
(Note 2)
0.5 V
0.5 V
=GND to V
=GND to V
CLK
CC
CC
IN
=1.0 MHz,
100 pF
=Gnd or V
CC
CLK
CC
=3.0 MHz
CC

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