MCP42050-I/SN Microchip Technology, MCP42050-I/SN Datasheet - Page 11

no-image

MCP42050-I/SN

Manufacturer Part Number
MCP42050-I/SN
Description
Single/Dual Digital Potentiometer with SPI Interface
Manufacturer
Microchip Technology
Datasheet
2.1
FIGURE 2-25:
Linearity Error Test Circuit (DNL, INL).
FIGURE 2-26:
Linearity Error Test Circuit (Rheostat operation
DNL, INL).
FIGURE 2-27:
Circuit.
2003 Microchip Technology Inc.
V+
DUT
Parametric Test Circuits
*Assume infinite input impedance
No Connection
*Assume infinite input impedance
A
B
W
DUT
A
B
V
Potentiometer Divider Non-
Resistor Position Non-
SS
Wiper Resistance Test
DUT
W
B
A
I
SW
= 0 to V
W
+
V+ = V
1LSB = V+/256
-
V
DD
MEAS
Rsw = 0.1V
Code = 00h
DD
I
W
*
+
+
-
-
Isw
0.1V
V
MEAS
*
FIGURE 2-28:
Test Circuit (PSS, PSRR).
FIGURE 2-29:
Circuit.
FIGURE 2-30:
OFFSET
V
GND
IN
V+
PSRR (dB) = 20LOG
V+ = V
PSS (%/%) = V
MCP41XXX/42XXX
~
V
IN
*Assume infinite input impedance
~
DD
Offset
2.5V DC
± 10%
V
DD
2.5V DC
A
V
B
A
V
DD
MEAS
DUT
A
Power Supply Sensitivity
Gain vs. Frequency Test
Capacitance Test Circuit.
DUT
A
B
DUT
(
W
W
V
V
MEAS
DD
-
+
+5V
B
+
-
)
+5V
MCP601
DS11195C-page 11
+
-
V
MEAS
V
V
*
OUT
OUT

Related parts for MCP42050-I/SN