SMP50 ST Microelectronics, SMP50 Datasheet - Page 6

• Manufacturer Part Number: SMP50
• Description: TRISIL FOR TELECOM EQUIPMENT PROTECTION
• Manufacturer: ST Microelectronics

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SMP50 / SMTPA / TPA
Figure 11: Test circuit 2 for I
Figure 12: Test circuit 3 for dynamic I
6/10
220V 50Hz
TEST PROCEDURE
Pulse test duration (tp = 20ms):
●
●
V
●
●
OUT
for Bidirectional devices = Switch K is closed
for Unidirectional devices = Switch K is open
Device with V
Device with V
This is a GO-NOGO test which allows to confirm the holding current (I ) level in a
functional test circuit.
TEST PROCEDURE
1/ Adjust the current level at the I value by short circuiting the AK of the D.U.T.
2/ Fire the D.U.T. with a surge current
3/ The D.U.T. will come back off-state within 50ms maximum.
selection:
V
BAT
BO
BO
= - 48 V
< 200V
≤
200V
BO
➔
➔
and V
V
V
OUT
OUT
1/4
R
= 480 V
= 250 V
H
BO
H
ton = 20ms
Vout
➔ I
RMS
RMS
parameters
parameters
PP
, R1 = 140
, R2 = 240
= 10A, 10/1000µs.
K
Ω
Ω
D.U.T
measurement
IBO
R1 = 140Ω
R2 = 240Ω
DUT
Surge generator
H
measurement
VBO