SMP50-XXX STMicroelectronics, SMP50-XXX Datasheet - Page 6

• Manufacturer Part Number: SMP50-XXX
• Description: TELECOM EQUIPMENT PROTECTION: TRISIL
• Manufacturer: STMicroelectronics

SMP50-xxx
TEST CIRCUIT 1 FOR DYNAMIC I
TEST CIRCUIT 2 for I
6/8
TEST PROCEDURE :
Pulse test duration (tp = 20ms):
- For Bidirectional devices = Switch K is closed
- For Unidirectional devices = Switch K is open.
V
- Device with V
- Device with V
OUT
100 V / µs, di/dt < 10 A / µs, Ipp = 50A
Key Tek ‘System 2’ generator with PN246I module
Key Tek ‘System 2’ generator with PN246I module
U
U
1 kV / µs, di/dt < 10 A / µs, Ipp = 10 A
220V 50Hz
Selection
- V
- V
OUT
10 µF
OUT
BO
60 µF
BO
BO
26 µH
AND V
= 480 V
= 250 V
200 Volt
200 Volt
2
BO
RMS
RMS
1/4
BO
PARAMETERS.
12
, R
, R
and V
2
1
= 240 .
ton = 20ms
Vout
= 140 .
250
BO
45
PARAMETERS
K
47
66
measurement
IBO
470
R1 = 140
R2 = 240
46 µH
DUT
83
0.36 nF
measurement
46 µH
VBO