MCP4132 Microchip Technology Inc., MCP4132 Datasheet - Page 3
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MCP4132
Manufacturer Part Number
MCP4132
Description
7/8-bit Single/dual Spi Digital Pot With Volatile Memory
Manufacturer
Microchip Technology Inc.
Datasheet
1.MCP4132.pdf
(82 pages)
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1.0
Absolute Maximum Ratings †
Voltage on V
Voltage on CS, SCK, SDI, SDI/SDO, and
SHDN with respect to V
Voltage on all other pins (PxA, PxW, PxB, and
SDO) with respect to V
Input clamp current, I
(V
Output clamp current, I
(V
Maximum output current sunk by any Output pin
Maximum output current sourced by any Output pin
Maximum current out of V
Maximum current into V
Maximum current into P
Storage temperature ....................................-65°C to +150°C
Ambient temperature with power applied
Total power dissipation (Note 1) ................................400 mW
Soldering temperature of leads (10 seconds) ............. +300°C
ESD protection on all pins .................................. ≥ 4 kV (HBM),
Maximum Junction Temperature (T
© 2007 Microchip Technology Inc.
......................................................................................25 mA
......................................................................................25 mA
.......................................................................... ≥ 300V (MM)
I
O
Note 1: Power dissipation is calculated as follows:
< 0, V
< 0 or V
I
ELECTRICAL
CHARACTERISTICS
> V
O
DD
DD
> V
with respect to V
, V
DD
I
) ..................................................±20 mA
> V
Pdis = V
IK
SS ............................
OK
SS ......................................
PP ON
DD
X
A, P
SS
pin ....................................100 mA
pin .................................100 mA
X
DD
HV pins) ......................±20 mA
W & P
SS
x {I
J
............... -0.6V to +7.0V
) ......................... +150°C
X
DD
B pins ............±2.5 mA
- ∑ I
-0.3V to V
-40°C to +125°C
OH
-0.6V to 12.5V
} + ∑ {(V
DD
+ 0.3V
MCP413X/415X/423X/425X
DD
-V
OH
) x I
OH
† Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied.
Exposure to maximum rating conditions for extended periods
may affect device reliability.
} + ∑(V
O
l x I
OL
)
DS22060A-page 3