LCP1521DEE STMicroelectronics, LCP1521DEE Datasheet - Page 5

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LCP1521DEE

Manufacturer Part Number
LCP1521DEE
Description
(LCP1521S/DEE) Programmable transient voltage suppressor
Manufacturer
STMicroelectronics
Datasheet
LCP1521S/LCP152DEE
Figure 3.
Figure 4.
1.2
10
Pulse (µs)
t
2
r
700
50
10
t
p
Functional Holding Current (I
Test circuit for V
(V is defined in unload condition)
V
This is a GO-NO GO test which allows to confirm the holding current (I ) level in a functional test circuit.
TEST PROCEDURE:
- Adjust the current level at the I value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current: I
- The D.U.T. will come back to the off-state within a duration of 50ms max.
P
V
P
BAT
1500
1500
2500
(V)
V
= - 100V
p
C
1
(µF)
C
20
10
1
1
FP
R
(nF)
200
L
and V
C
33
0
2
H
PP
R
DGL
(µH)
1
1.1
= 10A, 10/1000µs
L
0
0
R
parameters
H
2
) test circuit: GO-NO GO test
1.3
R
(
50
76
1
)
D.U.T
C
2
R
(
15
13
0
2
)
R
R
4
3
H
R
(
25
25
3
3
)
TIP
RING
G ND
Surge generator
R
(
25
25
3
4
)
Characteristics
I
(A)
30
30
38
PP
R
(
10
10
62
5/11
s
)

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