mc100es60t23 Integrated Device Technology, mc100es60t23 Datasheet - Page 3

• Manufacturer Part Number: mc100es60t23
• Description: Lvpecl-input Lvttl-output 1-ghz 3.3 V Dual Differential Lvpecl -to-lvttl Translator
• Manufacturer: Integrated Device Technology

IIDT™ / ICS™ LVTTL TRANSLATOR
MC100ES60T23
3.3V DUAL DIFFERENTIAL LVPECL TO LVTTL TRANSLATOR
Table 5. AC Characteristics (V
Table 4. LVTTL / LVCMOS Output DC Characteristics (V
Symbol
1. LVTTL output R
2. f
3. Skews are measured between outputs under identical conditions.
4. 200 mV input guarantees AC Characteristics.
Symbol
t
V
t
f
t
SKPP
t
t
SK++
V
OUT
t
t
SK--
SKP
r
V
CMR
V
PD
JIT
I
PP
/ t
OS
max
OH
OL
f
guaranteed for functionality only. V
Output Toggle Frequency
Propagation Delay
Data Path Skew++
Data Path Skew--
Part-to-Part Skew
Pulse Skew
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
Input Voltage Swing (Differential)
Differential Cross Point Voltage
Output Rise/Fall Times (0.8 V – 2.0 V)
Output HIGH Voltage
Output LOW Voltage
Output Short Circuit Current
L
= 500 Ω to GND and C
(3)
(3)
(3)
(3)
Characteristic
Characteristic
CC
(2)
Figure 2. TTL Output Loading Used for Device Evaluation
= 3.0 to 3.6 V; V
OL
(4)
L
= 20 pF to GND. Refer to
and V
*C
L
includes fixtures capacitance
OH
CLK0/Q0
CLK0/Q0
CLK1/Q1
CLK1/Q1
levels are guaranteed at DC only.
CHARACTERISTIC TEST
EE
= 0 V)
C
L
*
CC
I
I
OH
OL
(1)
= 3.0 to 3.6 V); T
; T
= 24 mA
= –24 mA
3
GND
Figure
156.25MHz, 12kHz - 20MHz
156.25MHz, 12kHz - 20MHz
A
125MHz, 12kHz - 20MHz
125MHz, 12kHz - 20MHz
= 40°C to 85°C
Condition
Test Conditions
2.
R
AC TEST LOAD
L
A
= 40°C to 85°C
ADVANCED CLOCK DRIVERS DEVICES
–140
Min
2.4
MC100ES60T23
V
EE
0.95
Min
200
50
–185
+1.2
Typ
0.40
0.18
0.38
0.21
Typ
REV 2 AUGUST 18, 2006
–275
Max
0.5
V
CC
1300
Max
1.75
500
120
140
500
250
250
–0.3
Unit
mA
V
V
Unit
MHz
mV
ns
ps
ps
ps
ps
ps
ps
ps
ps
ps
V