sy58620l Micrel Semiconductor, sy58620l Datasheet - Page 13

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sy58620l

Manufacturer Part Number
sy58620l
Description
Sy58620l Precision 4.25gbps Cml Backplane Transceiver With Integrated Loopback
Manufacturer
Micrel Semiconductor
Datasheet

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PRBS Discussion
LOS Testing
The LOS function is tested with a 2
Random Bit Stream) data pattern. A PRBS data
pattern of 2
approximation to an 8b10b-encoded NRZ data
stream. 8b10b encodes 8 bits of data and replaces it
with 10 bits of symbol. The extra bits are added to
improve transition density and the BER (Bit Error
Rate) of the system.
Deterministic Jitter Testing and the K28.5 Pattern
The K28.5 (11000001010011111010) and 2
data patterns are used to characterize DJ because
both data patterns have lower spectral frequency
content which provides a best approximation to
scrambled NRZ data streams.
Random Jitter Testing and the K28.7 Pattern
The K28.7 (1111100000…) data pattern is used to
measure RJ since the pattern is free of DJ. In
addition, because the K28.7 data pattern can be used
to compare the T
low frequency jitter components can be accumulated.
January 2006
Micrel, Inc.
7
-1 is used because it is a good
N
(N
TH
period) to the T
7
-1 PRBS (Pseudo
0
(1
23
st
-1 PRBS
period),
13
Power Supply Filtering
Although the SY58620L is fully differential, it is
recommended that the power supplies are filtered as
shown in Figure 4.
Item
C1, C2, C3, C23
C4, C5, C6, C22
L1, L2, L3
Figure 4. Power Supply Filtering Scheme
Table 1. Bill of Materials
hbwhelp@micrel.com
Description
0.1µF Capacitor
0.01µF Capacitor
1.2µH Ferrite Bead Inductor
or (408) 955-1690
M9999-012006-C
SY58620L

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