mc74lvx126 ON Semiconductor, mc74lvx126 Datasheet - Page 4

• Manufacturer Part Number: mc74lvx126
• Description: Quad Bus Buffe With 5vtolerant Inputs
• Manufacturer: ON Semiconductor

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
NOISE CHARACTERISTICS
ORDERING INFORMATION
Specifications Brochure, BRD8011/D.
MC74LVX126D
MC74LVX126M
MC74LVX126MEL
Symbol
V
V
V
V
OLP
OLV
IHD
ILD
D
O
t
PLH
Figure 5. Propagation Delay Test Circuit
*Includes all probe and jig capacitance
Quiet Output Maximum Dynamic V
Quiet Output Minimum Dynamic V
Minimum High Level Dynamic Input Voltage
Maximum Low Level Dynamic Input Voltage
50% V
DEVICE
UNDER
TEST
50%
Device
CC
Figure 3.
OUTPUT
(Input t
TEST POINT
r
= t
f
C
= 3.0 ns, C
L
*
OL
t
OL
PHL
Characteristic
SWITCHING WAVEFORMS
V
GND
CC
L
= 50 pF, V
http://onsemi.com
TEST CIRCUITS
SOEIAJ−14
SOEIAJ−14
Package
SOIC−14
CC
4
= 3.3 V, Measured in SOIC Package)
DEVICE
UNDER
TEST
OE
O
O
Figure 6. Three−State Test Circuit
*Includes all probe and jig capacitance
50%
OUTPUT
50% V
50% V
TEST POINT
t
t
PZL
PZH
CC
CC
Figure 4.
C
1 kW
t
t
L
PHZ
PLZ
*
2000 Tape & Reel
55 Units / Rail
50 Units / Rail
−0.3
Typ
0.3
Shipping
T
CONNECT TO V
TESTING t
CONNECT TO GND WHEN
TESTING t
A
= 25°C
V
V
OL
OH
†
+0.3 V
−0.3 V
Max
−0.5
PLZ
PHZ
0.5
2.0
0.8
V
GND
HIGH
IMPEDANCE
HIGH
IMPEDANCE
AND t
CC
AND t
CC
WHEN
PZL
PZH
Unit
.
.
V
V
V
V