mc74lvx50 ON Semiconductor, mc74lvx50 Datasheet - Page 5

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mc74lvx50

Manufacturer Part Number
mc74lvx50
Description
Hex Buffer
Manufacturer
ON Semiconductor
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
mc74lvx50DTR2G
Manufacturer:
ON/安森美
Quantity:
20 000
9. Metric Dimensions Govern−English are in parentheses for reference only.
10. A
EMBOSSED CARRIER DIMENSIONS (See Notes 9 and 10)
12 mm
16 mm
24 mm
Tape
8 mm
Size
0.50 mm max. The component cannot rotate more than 10 within the determined cavity
0
, B
0
4.35 mm
12.1 mm
20.1 mm
, and K
(0.179”)
8.2 mm
(0.323”)
(0.476”)
(0.791”)
Max
B
1
A
Y
Figure 3. Switching Waveforms
0
are determined by component size. The clearance between the components and the cavity must be within 0.05 mm min to
1.5 mm
(0.059”
(
50%
+0.004
50% V
+ 0.1
−0.0)
−0.0
0 004
D
CC
1.0 mm
(0.179”)
1.5 mm
(0.060)
Min
Min
D
1
t
PLH
1.75 mm
(0.069
0.004”)
0.1
E
INPUT
)
Figure 5. Input Equivalent Circuit
11.5 mm
3.5 mm
5.5 mm
7.5 mm
(0.217
(0.295
(0.453
0.002”)
0.002”)
0.004”)
0.004”)
(1.38
t
0.10
0.10
PHL
F
0.5
0.5
V
GND
http://onsemi.com
CC
MC74LVX50
11.9 mm
2.4 mm
(0.094”)
6.4 mm
(0.252”)
7.9 mm
(0.311”)
(0.468”)
Max
Max
Max
Max
K
5
12.0 mm
16.0 mm
4.0 mm
4.0 mm
8.0 mm
4.0 mm
8.0 mm
(0.157
(0.157
(0.315
(0.157
(0.315
(0.472
0.004”)
0.004”)
0.004”)
0.004”)
0.004”)
0.004”)
0.004”)
(0.63
0.10
0.10
0.10
0.10
0.10
0.10
0.10
P
4.0 mm
(0.157
0.004”)
P
0.1
0
)
*Includes all probe and jig capacitance
2.0 mm
DEVICE
UNDER
(0.079
0.004”)
Figure 4. Test Circuit
TEST
P
0.1
2
)
25 mm
30 mm
(0.98”)
(1.18”)
R
OUTPUT
TEST POINT
0.6 mm
(0.024)
T
C
L
*
12.0 mm
16.3 mm
24.3 mm
8.3 mm
(0.327)
(0.642)
(0.957)
(0.470
0.012”)
W
0.3

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