m4t28-br12sh6tr STMicroelectronics, m4t28-br12sh6tr Datasheet - Page 4

• Manufacturer Part Number: m4t28-br12sh6tr
• Description: 64 Kbit 8kb X8 Timekeeper Sram With Address/data Multiplexed
• Manufacturer: STMicroelectronics

M48T559Y
Table 4. AC Measurement Conditions
Note that Output Hi-Z is defined as the point where data is no longer
driven.
Table 5. Capacitance
(T
Note: 1. Effective capacitance measured with power supply at 5V.
Table 6. DC Characteristics
(T
Note: 1. Outputs deselected.
4/18
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Symbol
I
LRST
I
V
A
A
Symbol
I
CC2
V
I
LO
I
C
V
OH
LI
I
V
CC1
IL
= 25 °C, f = 1 MHz)
= 0 to 70 °C; V
CC
C
OL
IO
IH
2. Sampled only, not 100% tested.
3. Outputs deselected.
2. Input leakage current on input RESET pins.
3. AD0-AD7, AS0, AS1 active when E is high and V
4. Negative spikes of –1V allowed for up to 10ns once per cycle.
5. The IRQ pins is Open Drain.
6. Measured with Control Bits set as follows: R = '1'; W, ST, FT = '0'.
(1)
(1)
(4)
IN
(6)
(3)
(2)
(3)
Input Leakage Current
Output Leakage Current
Input Leakage Current
Supply Current
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Input Low Voltage
Input High Voltage
Output Low Voltage
Output Low Voltage (IRQ/FT)
Output High Voltage
Input Capacitance
Input / Output Capacitance
CC
= 4.5V to 5.5V)
(1, 2)
Parameter
Parameter
(5)
0 to 3V
1.5V
5ns
CC
> V
PFD
.
Figure 4. AC Testing Load Circuit
0V
Test Condition
Test Condition
0V
0V
E = V
Outputs open
I
I
V
I
OL
OH
OL
V
OUT
C L includes JIG capacitance
E = V
IN
V
DEVICE
= 2.1mA
UNDER
V
V
CC
= 10mA
OUT
= –1mA
TEST
= 0V
IN
IN
= 0V
– 0.2V
IH
V
V
V
CC
CC
CC
1k
–0.3
Min
2.2
2.4
Min
5V
V
1.9k
Max
CC
C L = 100pF
10
10
Max
100
0.8
0.4
0.4
±1
±5
50
10
7
+ 0.3
OUT
AI01673
Unit
pF
pF
Unit
mA
mA
mA
µA
µA
µA
V
V
V
V
V