mic3003 Micrel Semiconductor, mic3003 Datasheet - Page 37

• Manufacturer Part Number: mic3003
• Description: Fom Management Ic With Internal Calibration
• Manufacturer: Micrel Semiconductor

Micrel, Inc.
Test and Calibration Features
Numerous features are included in the MIC3003 to
facilitate development, testing, and diagnostics. These
May 2009
Function
Analog loop-back
Fault comparator disable control
Fault comparator spin-on-channel
mode
Fault comparator output read-back
TRSOUT, /INT read-back
Inhibit EEPROM write cycles
APC calibration mode
Continuity checking
Halt A/D
ADC idle flag
A/D one-shot mode
A/D spin-on-channel mode
Channel selection
LUT index read-back
Manufacturer and device ID registers
Description
Provides analog visibility of op-amp and DAC outputs via the ADC
Selects a single fault comparator channel
Speeds repetitive writes to registers backed up by NVRAM
Allows direct writes to MODDAC and APCDAC (temperature
compensation not used)
Stops A/D conversions; ADC in one-shot mode
Performs a single A/D conversion on the selected input channel
Selects a single input channel
Selects ADC or fault comparator channel for spin-on-channel
modes
Facilitates presence detection and version control
Disables the fault comparator
Allows host to read individual fault comparator outputs
Allows host to read the state of these pins
Forcing of RXLOS, TXFAULT, /INT
Indicates ADC status
Permits visibility of the LUT index calculated by the state-machine
Table 22. Test and Diagnostic Features
features are available via registers in the OEM area. As
shown in Table 22, these features include:
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Register(s)
OEMCFG0
OEMCAL0
OEMCAL0
OEMCAL0
OEMCAL0
OEMCAL0
OEMCAL1
OEMCAL1
OEMCAL1
OEMCAL1
OEMCAL1
LUTINDX
MFG_ID,
or [phone]
OEMRD
OEMRD
DEV_ID
Control
M9999-052709-A
MIC3003