nlx1g57 ON Semiconductor, nlx1g57 Datasheet - Page 4

• Manufacturer Part Number: nlx1g57
• Description: Configurable Multifunction Gate
• Manufacturer: ON Semiconductor

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm by 1 inch, 2 ounce copper trace no air flow.
2. Tested to EIA/JESD22-A114-A.
3. Tested to EIA/JESD22-A115-A.
4. Tested to JESD22-C101-A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
MAXIMUM RATINGS
I
Symbol
Symbol
LATCHUP
Dt/DV
V
V
V
T
I
MSL
V
V
V
I
I
GND
V
F
OUT
I
STG
T
T
ESD
OUT
T
OK
I
CC
CC
IK
CC
O
IN
IN
R
A
L
J
Positive DC Supply Voltage
Digital Input Voltage
Output Voltage
Operating Free-Air Temperature
Input Transition Rise or Fall Rate
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
DC Supply Current Per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Moisture Sensitivity
Flammability Rating Oxygen
ESD Withstand Voltage
Latchup Performance Above V
CC
Parameter
Parameter
and Below GND at 125°C (Note 5)
Charged Device Model (Note 4)
Human Body Model (Note 2)
http://onsemi.com
Machine Model (Note 3)
NLX1G57
V
V
V
CC
CC
CC
4
= 2.5 V $ 0.2 V
= 3.3 V $ 0.3 V
= 5.0 V $ 0.5 V
Index: 28 to 34
V
OUT
V
IN
< GND
< GND
UL 94 V-0 @ 0.125 in
1.65
Min
-55
0
0
0
0
0
-0.5 to +7.0
-0.5 to +7.0
-0.5 to +7.0
-65 to +150
Level 1
$100
$100
>2000
$500
Value
>200
$50
-50
-50
260
150
N/A
No Limit
No Limit
No Limit
+125
Max
5.5
5.5
5.5
nS/V
Unit
Unit
mA
mA
mA
mA
mA
mA
°C
°C
°C
°C
V
V
V
V
V
V
V