74cbtlv3126ds NXP Semiconductors, 74cbtlv3126ds Datasheet - Page 5

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74cbtlv3126ds

Manufacturer Part Number
74cbtlv3126ds
Description
4-bit Bus Switch
Manufacturer
NXP Semiconductors
Datasheet

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Manufacturer:
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NXP Semiconductors
Table 6.
At recommended operating conditions voltages are referenced to GND (ground = 0 V).
[1]
[2]
74CBTLV3126_1
Product data sheet
Symbol Parameter
I
I
I
ΔI
C
C
C
S(ON)
OFF
CC
Fig 6.
I
S(OFF)
S(ON)
CC
All typical values are measured at T
One input at 3 V, other inputs at V
V
ON-state
leakage current
power-off
leakage current
supply current
additional
supply current
input
capacitance
OFF-state
capacitance
ON-state
capacitance
IL
V
Test circuit for measuring OFF-state leakage
current (one switch)
I
Static characteristics
= V
V I
CC
I S
A
9.1 Test circuits
or GND and V
nOE
nB
Conditions
V
V
V
V
V
V
pin nOE; V
V
V
pin nOE; V
V
V
V
V
CC
I
CC
I
SW
CC
SW
CC
I
CC
CC
CC
= 0 V to 3.3 V
or V
= GND or V
GND
O
= 3.6 V; see
= 0 V
= 3.6 V
= 3.6 V
= 3.3 V; V
= 3.3 V; V
= GND or V
= GND or V
= GND or V
nA
CC
O
…continued
amb
= 0 V to 3.6 V;
or GND.
I
CC
= 25 °C.
= V
I S
= 3.3 V;
A
CC
I
I
CC
= 0 V to 3.3 V
= 0 V to 3.3 V
CC
CC
CC
; I
Figure 7
001aal249
.
O
− 0.6 V;
;
;
= 0 A;
Rev. 01 — 5 January 2010
V O
[2]
T
Fig 7.
Min
amb
-
-
-
-
-
-
-
= −40 °C to +85 °C
V
IH
V
Test circuit for measuring ON-state leakage
current (one switch)
Typ
14.3
I
0.9
5.2
= V
-
-
-
-
V I
[1]
CC
I S
A
or GND and V
Max
±10
300
±1
10
-
-
-
nOE
nA
T
V
74CBTLV3126
amb
CC
GND
O
Min
= open circuit.
nB
= −40 °C to +125 °C Unit
-
-
-
-
-
-
-
© NXP B.V. 2010. All rights reserved.
4-bit bus switch
001aal250
2000
Max
±20
±50
50
-
-
-
V O
5 of 16
μA
μA
μA
μA
pF
pF
pF

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