lh28f800bje-pttlz1 Sharp Microelectronics of the Americas, lh28f800bje-pttlz1 Datasheet - Page 32
lh28f800bje-pttlz1
Manufacturer Part Number
lh28f800bje-pttlz1
Description
Manufacturer
Sharp Microelectronics of the Americas
Datasheet
1.LH28F800BJE-PTTLZ1.pdf
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6.2.2 AC Input/Output Test Conditions
Figure 15. Transient Equivalent Testing Load Circuit
DEVICE
UNDER
TEST
AC test inputs are driven at 3.1V for a Logic "1" and 0.0V for a Logic "0". Input timing begins, and output timing ends, at 1.55V.
Input rise and fall times (10% to 90%) <10 ns.
3.1
0.0
C
L
Capacitance
Includes Jig
Figure 14. Transient Input/Output Reference Waveform for V
INPUT
1.3V
R
C
1N914
L
L
=3.3k
1.55
OUT
TEST POINTS
V
CC
Test Configuration Capacitance Loading Value
=3.1V-3.5V
Test Configuration
CC
=3.1V-3.5V
1.55
OUTPUT
C
L
50
(pF)
Rev. 1.27
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