lh28f400su-lc Sharp Microelectronics of the Americas, lh28f400su-lc Datasheet - Page 21

• Manufacturer Part Number: lh28f400su-lc
• Description: 512k 256k Flash Memory
• Manufacturer: Sharp Microelectronics of the Americas

4M (512K × 8, 256K × 16) Flash Memory
Timing Nomenclature
For 3.3 V systems use 1.5 V cross point definitions.
Each timing parameter consists of 5 characters. Some common examples are defined below:
t
t
t
t
t
CE
OE
ACC
AS
DH
3.0
0.0
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1'
and 0.0 V for a Logic '0'. Input timing begins,
and output timing ends at 1.5 V. Input rise
and fall times (10% to 90%) < 10 ns.
3 V
W
Q
G
A
D
E
P
R
V
INPUT
t
t
t
t
t
ELQV
GLQV
AVQV
AVWH
WHDX
Reference Waveform (V
Figure 16. Transient Input/Output
Address Inputs
Data Inputs
Data Outputs
CE
OE
WE (Write Enable)
RP
RY
Any Voltage Level
V
1.5
CC
»
»
»
/ BY
»
(Chip Enable)
(Deep Power-Down Pin)
(Output Enable)
at 3.0 V Min.
PIN CHARACTERS
time (t) from CE
time (t) from OE
time (t) from address (A) valid (V) to the outputs (Q) becoming valid (V)
time (t) from address (A) valid (V) to WE
time (t) from WE
»
(Ready/Busy)
TEST POINTS
»
»
»
(E) going low (L) to the outputs (Q) becoming valid (V)
(G) going low (L) to the outputs (Q) becoming valid (V)
(W) going high (H) to when the data (D) can become undefined (X)
CC
= 3.3 V)
28F400SUH-LC15-14
H
V
X
L
Z
1.5
OUTPUT
High
Low
Valid
Driven, but not necessarily valid
High Impedance
»
(W) going high (H)
PIN STATES
FROM OUTPUT
UNDER TEST
Figure 17. Transient Equivalent Testing
Load Circuit (V
2.5 ns OF 50
TOTAL CAPACITANCE = 50 pF
CC
TRANSMISSION LINE
= 3.3 V)
LH28F400SU-LC
28F400SUH-LC15-15
POINT
TEST
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