str755fvx STMicroelectronics, str755fvx Datasheet - Page 51

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str755fvx

Manufacturer Part Number
str755fvx
Description
Arm7tdmi-s, 32-bit Mcu With Flash, Smi, 3 Std 16-bit Timers Pwm Timer, Fast 10-bit Adc, I2c, Uart, Ssp, Usb And Can
Manufacturer
STMicroelectronics
Datasheet
STR750F
Electro Magnetic Interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 28.
Absolute Maximum Ratings (Electrical Sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: Human Body Model and Machine Model. This test conforms to the
JESD22-A114A/A115A standard.
Table 29.
1. Data based on product characterisation, not tested in production.
Symbo
V
V
V
S
Symbol
ESD(HBM)
ESD(CDM)
ESD(MM)
EMI
l
Peak level
Parameter
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Machine Model)
Electro-static discharge voltage
(Charge Device Model)
EMI characteristics
Absolute maximum ratings
Flash devices:
V
T
LQFP64 package
conforming to SAE J
1752/3
A
DD_IO
=+25° C,
Ratings
Conditions
=3.3 V or 5 V,
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
Frequency Band
Monitored
T
A
=+25° C
Conditions
Max vs. [f
4/32MHz
22
31
19
>4
Electrical parameters
OSC4M
Maximum
value
4/60MHz
2000
200
750
/f
26
26
23
>4
HCLK
(1)
]
dBµV
Unit
Unit
51/71
-
V

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