pa905c6rr Fuji Electric holdings CO.,Ltd, pa905c6rr Datasheet - Page 5

• Manufacturer Part Number: pa905c6rr
• Description: Silicon Diode Power Diodes
• Manufacturer: Fuji Electric holdings CO.,Ltd

Fuji Electric Device Technology Co.,Ltd.
Failure Criteria
Test
No.
10
1
2
3
4
5
6
7
8
9
High Temp.
Storage
Low Temp.
Storage
Temperature
Humidity
Storage
Temperature
Humidity
Bias
Unsaturated
Pressurized
Vapor
Temperature
Cycle
Thermal
Shock
Steady state
Operating
life
Intermittent
Operating
life
High Temp.
Reverse
Bias
Items
Test
Temperature :Ｔstg max
Test duration : 1000h
Temperature :Ｔstg min
Test duration : 1000h
Temperature : 85±2°C
Relative humidity : 85±5%
Test duration : 1000h
Temperature : 85±2°C
Relative humidity : 85±5%
Bias Voltage : V
Test duration : 1000h
Temperature : 130±2°C
Relative humidity : 85±5%
Vapor pressure : 230kPa
Test duration : 48h
High temp. side : Tstg max
Room temp. : 5～35℃
Low temp. side : Tstg min
Duration time : HT 30min,RT 5min LT 30min
Number of cycles : 100 cycles
Fluid : pure water(running water)
High temp. side : 100+0/-5°C
Low temp. side : 0+5/-0°C
Duration time : HT 5min,LT 5min
Number of cycles : 100 cycles
Ta=25±5°C
Rated load
Test duration : 1000h
Tj=Tjmax ～50℃
3min ON, 3min OFF
Test duration : 10000cycles
Temperature : Ta=100 °C
Bias Voltage : VR=V
Test duration : 1000h
I
V
R
F
≦USL x 1.1
≦USL x 5
Testing methods and Conditions
RRM
× 0.8
RRM
duty=1/2
USL : Upper specification Limit
MS5D3030
EIAJ ED4701
EIAJ
ED4701/201
EIAJ
ED4701/202
EIAJ
ED4701/103
test code C
EIAJ
ED4701/103
test code C
EIAJ
ED4701/103
test code F
EIAJ
ED4701/105
EIAJ
ED4701/307
test code A
EIAJ
ED4701/106
EIAJ
ED4701/101
Reference
Standard
Sampling
number
22
22
22
22
22
22
22
22
22
22
5/12
Acceptance
H04-004-03a
number
(0 : 1)