lrs1387 Sharp Microelectronics of the Americas, lrs1387 Datasheet - Page 23

• Manufacturer Part Number: lrs1387
• Description: Dual Work Boot Block Flash Sram
• Manufacturer: Sharp Microelectronics of the Americas

sharp
12.3 Write Cycle (F-WE / F-CE Controlled)
Notes:
t
t
t
t
t
t
t
t
t
t
t
t
t
t
DVWH
WHEH
WHDX
WHAX
VVWH
WHWL
WLWH
AVWH
SHWH
WHGL
WHRL
1. The timing characteristics for reading the status register during block erase, full chip erase, (page buffer) program
2. A write operation can be initiated and terminated with either F-CE or F-WE.
3. Sampled, not 100% tested.
4. Write pulse width (t
5. Write pulse width high (t
6. F-V
7. t
8. See 5.1 Command Definitions for valid address and data for block erase, full chip erase, (page buffer) program, or lock bit
ELWL
PHWL
WHR0
Symbol
t
t
t
operations are the same as during read-only operations. See the AC Characteristics for read cycle.
F-CE or F-WE (whichever goes high first). Hence, t
edge of F-CE or F-WE (whichever goes low last). Hence, t
and held at F-V
configuration.
QVVL
QVSL
AVAV
WHR0
(t
(t
(t
(t
(t
(t
(t
(t
(t
(t
(t
(t
(t
(t
WLEL
EHWH
PP
PHEL
DVEH
AVEH
EHDX
EHAX
SHEH
VVEH
EHGL
EHR0
EHRL
ELEH
EHEL
should be held at F-V
(t
EHR0
)
)
) F-CE (F-WE) Setup to F-WE (F-CE) Going Low
) F-WP High Setup to F-WE (F-CE) Going High
) F-WE (F-CE) High to F-RY/BY Going Low
) F-WE (F-CE) Pulse Width
) Address Setup to F-WE (F-CE) Going High
) Write Recovery before Read
) Data Setup to F-WE (F-CE) Going High
) Data Hold from F-WE (F-CE) High
) Address Hold from F-WE (F-CE) High
) F-WE (F-CE) Pulse Width High
) F-V
) F-CE (F-WE) Hold from F-WE (F-CE) High
Write cycle time
F-RST High Recovery to F-WE (F-CE) Going Low
F-WP High Hold from Valid SRD, F-RY/BY High-Z
F-V
F-WE (F-CE) High to SR.7 Going “0”
) after the Read Query or Read Identifier Codes command=t
PP
PP
PP
=V
Setup to F-WE (F-CE) Going High
Hold from Valid SRD, F-RY/BY High-Z
WP
PPH1
) is defined from the falling edge of F-CE or F-WE (whichever goes low last) to the rising edge of
WPH
until determination of full chip erase success (SR.1/3/5=0).
PP
) is defined from the rising edge of F-CE or F-WE (whichever goes high first) to the falling
=V
PPH1/2
(1,2)
Parameter
until determination of block erase, (page buffer) program success (SR.1/3/4/5=0)
L R S1 3 8 7
WP
=t
WLWH
WPH
=t
=t
WHWL
ELEH
=t
=t
WLEH
EHEL
AVQV
(T
A
=t
=t
+100ns.
= -25°C to +85°C, F-V
ELWH
WHEL
Notes
3, 6
3, 6
3, 7
3
4
4
8
8
5
3
3
3
.
=t
EHWL
Min.
150
200
85
60
40
50
30
30
0
0
0
0
0
0
0
.
t
AVQV
Max.
CC
100
= 2.7V to 3.3V)
+40
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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