evm629axf Semtech Corporation, evm629axf Datasheet
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evm629axf
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evm629axf Summary of contents
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TEST AND MEASUREMENT PRODUCTS Description The Edge629 is a monolithic timing delay and signal fanout solution manufactured in a high-performance bipolar pro- cess. In Automatic Test Equipment (ATE) applications, the Edge629 buffers, distributes, and aligns timing signals across multiple channels ...
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TEST AND MEASUREMENT PRODUCTS PIN Description ...
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TEST AND MEASUREMENT PRODUCTS PIN Description (continued IN3* IN3 VCC3 VCC2 IN2* IN2 VEE2 IN* IN VEE1 IN1 IN1* VCC1 VCC0 IN0 IN0* 17 2005 Semtech Corp. Rev. 3, 8/1/05 E629AXF 64 Pin ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description Introduction The Edge629 is a quad channel delay element with 2 basic operating modes: 1) Fanout – 1 signal in, 4 signals out 2) Pass Through – 4 signals in, 4 signals out In ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Fine Delay Fine delay is accomplished using an analog delay cell and an on-chip 6 bit DAC (see Figure 2). The fine delay range is designed to be ~2X the coarse delay resolution. ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Falling Edge Adjustment The falling edge of a signal may be adjusted to compen- sate for any system level pulse width distortion that may occur. Falling edge adjust (FEA) is accomplished using an ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Programming The Edge629 is programmed serially with 3 control lines: SDI – serial data input CS – chip select UPDATE – register update which are all synchronous with CK. With CS valid (high), ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) CK0 ... CK SDI CD0 CD1 CD2 CD3 CD4 FD0 FD1 FD2 FD3 FD4 SDI SDI FE0 FE1 FE2 FE3 FE4 CS UPDATE 2005 Semtech Corp. Rev. 3, 8/1/05 629 Digital Interface Timing ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued Channel Channel Channel Channel 3 E UPDATE CS CK SDI 2005 Semtech Corp. Rev. 3, 8/1/ ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Timing Inputs IN/IN* and IN0/IN0* – IN3/IN3* are high speed differen- tial inputs which require >300 mV of differential input voltage for reliable switching. These inputs may receive differential input signals with amplitudes ...
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TEST AND MEASUREMENT PRODUCTS Package Information PIN Descriptions N 1 EXPOSED HEATSINK 3.56 .50 DIA. –A– Top View .20 RAD. TYP . 20 RAD. TYP . 6˚ 4˚ A .25 b .17 MAX ddd M C A– ...
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TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions ...
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TEST AND MEASUREMENT PRODUCTS DC Characteristics ...
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TEST AND MEASUREMENT PRODUCTS AC Characteristics ...
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TEST AND MEASUREMENT PRODUCTS AC Characteristics (continued) Test Conditions (unless otherwise specified): "Recommended Operating Conditions." Note 1: Tested with an input pulse = 50 ns. This parameter is guaranteed by characterization for input pulse widths 700 ps. Note 2: Coarse ...
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... Semtech Corporation Test and Measurement Division 16 Edge629 ...